The invention discloses a multi-stress comprehensive
satellite electronic product service life prediction method. The force thermoelectric comprehensive use environment of the
satellite electronic product is fully considered; accumulating and competition relationships between fault
modes and fault mechanisms; single-stress
simulation analysis and multi-stress cumulative
damage analysis are carriedout; the life prediction of the
satellite electronic product is completed by combining a theoretical model and a
simulation analysis result; compared with the prior art, the method has very high
engineering practicability, so that the service life prediction work in the past is limited under certain
engineering development conditions such as
insufficient sample size and
test data, the service life prediction of the product can be carried out, and the efficiency of service life prediction of the satellite electronic product can be greatly improved; time and cost for service
life evaluation ofsatellite electronic products can be effectively saved, service life prediction efficiency is greatly improved, and
economic benefits are high. Important reference is provided for service life and reliability evaluation of satellite electronic products, and the method can be popularized and applied to service life prediction and analysis work of electronic products in other fields.