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124 results about "Exponential decay" patented technology

A quantity is subject to exponential decay if it decreases at a rate proportional to its current value. Symbolically, this process can be expressed by the following differential equation, where N is the quantity and λ (lambda) is a positive rate called the exponential decay constant: dN/dt=-λN. The solution to this equation (see derivation below) is: N(t)=N₀e⁻λᵗ, where N(t) is the quantity at time t, and N₀ = N(0) is the initial quantity, i.e. the quantity at time t = 0.

Method and apparatus for measuring oxygen concentration

An apparatus and non-invasive method of measuring oxygen by exciting a luminescent compound disposed in a container and then measuring the intensity of the light emitted by the excited luminescent compound as it relaxes to the ground state. A plot of emission intensity as a function of time results in an exponential decay curve the area of which is inversely proportional to the oxygen concentration. The oxygen concentration can be determined over a wide temperature range by measuring the temperature of the container and the emission intensity and then applying the following equation: [O2]=(ATa(T)2+BTa(T)+CTa)(tau)2+(ATb(T)2+BTb(T)+CTb)(tau)+(ATc(T)2+BTc(T)+CTc) T is the measured temperature; tau is the area of the exponential decay curve; and ATa, BTa, CTa, ATb, BTb, CTb, ATc, BTc, and CTc are coefficients that are specific to the luminescent compound being examined.
Owner:CRYOVAC INC

Method for determining detection efficiency of internal exposure HPGe detector based on CT data

The invention relates to a method for determining the detection efficiency of an internal exposure HPGe detector based on CT data. Based on different energy gamma ray full-energy peak detection efficiency measuring data, Monte Carlo particle transport numerical values are adopted for computing, so that geometrical parameters of a detector sensitive area are adjusted, and the geometrical parameters of the detector sensitive area are obtained; the Monte Carlo particle transport numerical values are adopted for computing, so that the corresponding differential detection efficiency distribution of different energy gamma rays on the surfaces of the detector in different discrete areas and different discrete angle phase spaces is solved; based on CT medical image data of a human body to be detected, a voxel model of human anatomy structural features and a voxel model of an interesting organ or area are established, and the interesting organ or area serves as a source area; an exponential decay formula is used for solving the direct-through gamma ray share from a source area voxel to a surface element on the surface of the detector, and established differential detection efficiency distribution data are used for obtaining the detector full-energy peak detection efficiency specific to the source area through the multiple integral.
Owner:HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI

Method for predicting milling residual stress field of titanium alloy

The invention relates to a method for predicting a milling residual stress field of titanium alloy. The method can predict the milling residual stress field of the titanium alloy based on exponential decay functions and includes the main steps: 1, determining an exponential decay function model of a milling residual stress field; 2, determining a relation model between a residual stress field control factor and a milling process parameter; 3 selecting the milling process parameter and performing encoding; 4, designing a test scheme, and performing a milling test; 5, testing the residue stress field; 6 solving the residual stress field control factor. The method uses the milling process parameter as an input condition, and can acquire distribution of the residue stress along a surface in the milling process parameter by solving a model coefficient, is simple and reliable, is fast in prediction speed, is high in accuracy, can avoid lots of complex tests, can avoid difficulties of the finite element method and the physical analytical method, and can be used by mass engineering and technical staff.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

Power system fault signal detection and waveform identification method based on optimization algorithm

ActiveCN103675544AAccurate estimateAccurate waveform parameter identification resultsElectrical testingElectric power systemDigital signal
The invention discloses a power system fault signal detection and waveform identification method based on the optimization algorithm. The power system fault signal detection and waveform identification method includes the following steps: firstly, collecting power system signal data through a current transformer, connecting the current transformer with a data collecting card, converting the power system signal data through the data collecting card into digital signals, sending the digital signals to an upper computer, then, estimating fundamental components (including the amplitudes, the frequency and the phases), harmonic components (including the amplitudes, the frequency and the phases of harmonic waves), and exponential decay direct current deviations (including amplitudes and time constants), and a fault initial point with the optimization algorithm on the upper computer, and finally reconstructing power system signals according to the estimated parameters, wherein the optimization objective is that the least square variance error between the reconstructed signals and actually-measured signals is minimum. According to the power system fault signal detection and waveform identification method, the signal parameters under the fault-free condition and the fault condition can be accurately estimated; detection of the fault initial point and recognition on fault signal waveforms are carried out at the same time, and the two tasks can be completed in a sampling window with the long half-circle through the optimization algorithm.
Owner:SOUTH CHINA UNIV OF TECH

Remote sensing sub-pixel map-making method based on integrated pixel level and sub-pixel level spatial correlation characteristics

The invention discloses a remote sensing sub-pixel map-making method based on integrated pixel level and sub-pixel level spatial correlation characteristics. The method includes the steps that firstly, a frequently-used pixel level spatial correlation characteristic description method (a spatial attraction model) is utilized for extracting pixel level spatial correlation characteristics from soft classification information (category proportions) of a neighborhood pixel easily and rapidly without iteration; secondly, a widely-used sub-pixel level spatial correlation characteristic description method (an exponential decay model) is utilized for extracting sub-pixel level spatial correlation characteristics from a sub-pixel map-making iteration result; then, the spatial correlation characteristics of the pixel level and the sub-pixel level are normalized and fused to obtain the integrated spatial correlation characteristic value used for determining the sub-pixel categorical attribute; finally, the optimal spatial layout of the sub-pixel with the largest sum of all the category spatial correlation characteristic values in mixed pixels is obtained according to the integrated spatial correlation characteristic value through a classical binary branching-bounding integer programming algorithm. The remote sensing sub-pixel map-making method is high in calculation speed and simulation precision.
Owner:INST OF GEOGRAPHICAL SCI & NATURAL RESOURCE RES CAS

Wavelength selection based ultraviolet-visible spectrum multi-metal ion detection method

The invention discloses an ultraviolet-visible spectrum polymetallic ion detection method based on wavelength screening, which can quickly and efficiently eliminate redundant and interference wavelength information, reduce wavelength screening time, and improve the accuracy and robustness of the model. The method comprises: S1, using ultraviolet-visible spectrophotometry to obtain the mixed absorbance of a solution containing multiple metal ions in the full band of 400-700nm; S2, sampling the obtained absorbance by using a multiple cycle Monte Carlo method, and using exponential decay The function preliminarily selects the wavelength, and uses the non-informative variable elimination method to select the effective wavelength point in the mixed absorbance; S3, establishes the regression model between the concentration and the mixed absorbance based on the PLS method, and separates and calculates the concentration of each ion.
Owner:CENT SOUTH UNIV
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