The invention provides a low-
voltage electrical complete switch
equipment temperature rise test
system which is directly connected a commercial power
voltage source. The
system comprises tested low-
voltage electrical complete switch equipment, three-phase AC program-controlled
constant current sources and a short-circuit
copper bar. The complete switch equipment comprises a main
bus and multiple feeder branches and switch equipment. The inlet wire end of the main
bus is short-connected via the short-circuit
copper bar. There are multiple three-phase AC program-controlled
constant current sources. The output ends of all the three-phase AC program-controlled
constant current sources are connected with the corresponding feeder
branch loops, and the input ends are connected with commercial power for power supply.
Value assignment of current of all the loops can be performed on touch of the corresponding three-phase program-controlled constant current. Current of all the loops is superposed and then the current requirements of all parts can be realized. Impedance of the main
bus, the feeder branches and the switches changes along with temperature in the temperature rise test. Current of all the feeder loops is automatically compensated by three-phase program-controlled constant current so that current of all parts of the main bus, the feeder loops and the switch equipment is ensured to be the same with the corresponding designated current. With application of the
system, cost is low, and problems of adjustment difficulty and instable current can be overcome so that objectives of reducing temperature rise test error and
electric energy loss can be achieved.