30results about How to "Displacement is detected" patented technology

A control panel for controlling a device in response to user indications, the control panel comprising, a position sensing element (60) having a sensing surface, and a position interface circuit (76). The position interface circuit (76) is operable to determine a position of an object (100) on the sensing surface, when the object (100) is applied to the sensing surface of the position sensing element (60). At least one pressure sensing device (54, 66) and the sensing surface of the position sensing element (60) are arranged with the effect that a displacement of the sensing surface with respect to the pressure sensing device in response to the pressure applied by the object is detectable by the pressure sensing device. As such, in one example, the position interface circuit (76) is operable to identify one or more of a plurality of user indicated signals by correlating the position of the object on the sensing surface with a pressure detected by the pressure sensing device. The sensing surface may include pre-designated and pre-determined locations representing virtual buttons so that by determining whether the object is at one of a plurality of pre-determined locations on the sensing surface of the position sensing element, the position interface circuit (76) can identify the user indicated signal by correlating the position of the object at one of the predetermined locations with the detected pressure, each of the pre-determined location corresponding to one of the plurality of user indicated signals.

To make available a method for checking a marking element for displacement in relation to a holding structure, in particular a bone, on which this marking element is fixed, said marking element being used for determining position in navigational surgery, and said marking element functioning with the greatest possible precision, it is proposed to choose a point of orientation which is in a unique relationship to the holding structure and to monitor the position of the point of orientation in a reference system of the marking element.

An electronic percussion instrument with a single cymbal and a displacement detection apparatus that detects the displacement of an electronic cymbal. The electronic percussion instrument is designed to allows users to simulate the performance feel of an acoustic cymbal with two cymbals. The single cymbal of the instrument moves vertically in conformance with the depression of a pedal to simulate the “open” and “closed” positions of an acoustic cymbal. The displacement detection apparatus electronically detects the vertical displacement of the cymbal in the electronic percussion instrument through measuring resistance change of the detector in conformance with the movements of the cymbal.

A sealed air purifier is disclosed. A housing is formed by connecting a first shell and a second shell. The first shell and the second shell communicate via separable connecting base and connector. A retractable bag encloses the connecting base and the connector. A sealing structure is provided between both ends of the bag. The first shell has an air inlet connecting the inside and the outside and a gate to control the airflow. A compression assembly is disposed in the first shell. The second shell has an air outlet connecting the inside and the outside and a blocking element to control the air outlet. The second shell has a sterilizing device and a super ULPA filter. When the gate closes the air inlet, the compression assembly, sterilizing device, and the air outlet close correspondingly, so that the inside of the housing is isolated. Thus, the viruses remaining therein do not spread with air.

The present invention provides an equipment for measuring the vertical distance or pitch between a plurality of thin substrates inside a container body, including an optical component to transmit a light beam to a thin substrate in the container body and receive light beam reflected from the thin substrate, a scanning device to drive the optical component to move along vertical direction of the thin substrates for measuring the vertical distance or pitch between the plurality of thin substrates in the container body, and a rotation base to carry and rotate the container body to a plurality of angles for the plurality of thin substrates inside the container body to be measured from different angular positions.

A probe apparatus includes a first stage, a second stage, a third stage and an image pickup. A Z position measuring unit measures a Z direction position of the mounting table and has a Z scale extending in the Z direction and a reading unit for reading the Z scale. A computation unit obtains a calculated contact position between the probes and the electrode pads of the substrate to be inspected based on images picked up by the image pickup with respect to a coordinate position on coordinates of a driving system which includes a Z direction position and X and Y direction positions measured by a measuring unit for measuring X and Y direction positions of the mounting table. A correcting unit corrects the Z direction position of the contact position based on the change amount thereof for a next contact operation.

A method for detecting displacement with sub-pixel accuracy includes the steps of: capturing a first array image and a second array image; interpolating the first array image to form a reference image; interpolating the second array image to form a comparison image; comparing the reference image with the comparison image so as to obtain a displacement. The present invention also provides an apparatus for detecting displacement with sub-pixel accuracy.

An amplitude of an electrical signal generated on the basis of a light detected by a light receiving part of an optical encoder is monitored and, using the monitored result, a displacement between a moving scale and fixed slits of an optical encoder (or a displacement of a moving part in a motor attached with an optical encoder) is detected. Further, a load applied to a moving part in a motor attached with an optical encoder is detected using the monitored result.

An image processing apparatus includes: when a probe is moved, a shift amount correction section configured to correct an amount of shift from a first frame to a second frame being a frame at different time from the first frame; and a distortion amount calculation section configured to calculate an amount of distortion on the basis of a phase difference detected from the first frame and the second frame having been subjected to shift amount correction by the shift amount correction section.

A form measuring apparatus includes a base; an arm capable of swinging relative to the base; a coupler coupling the base and the arm, and having a deformation region that is capable of elastic deformation between the base and the arm; and a distortion detector installed in the deformation region. In the form measuring apparatus, a stylus is mounted to the arm and can slide along a surface of a work piece.

A displacement detecting device includes a first diffraction grating, a light source, a displacement detecting unit, and a light receiving unit. The displacement detecting unit includes a light flux dividing unit, a second diffraction grating, and a reference reflecting member. An incident angle of a first light flux to the first diffraction grating, a diffraction angle of the first diffraction grating, an incident angle of the first light flux to the second diffraction grating, and a diffraction angle of the second diffraction grating are angles at which a displacement amount in an optical path length of the first light flux from the light flux dividing unit to the first diffraction grating and a displacement amount in an optical path length of the first light flux from the first diffraction grating to the second diffraction grating become equal in a case where a measured member is displaced in a direction orthogonal to a measured surface.

This invention relates to a microelectromechanical device for mechanical characterization of a specimen. In one embodiment the device may incorporate a substrate, at least one first flexure bearing and at least one second flexure bearing, both being supported on the substrate. First and second movable shuttles may be used which are supported above the substrate by the flexure bearings so that each is free to move linearly relative to the substrate. Ends of the movable shuttles are separated by a gap. A thermal actuator may be connected to one end of the first movable shuttle, and operates to cause the first movable shuttle to move in a direction parallel to the surface of the substrate in response to a signal applied to the thermal actuator. A first capacitive sensor may be formed between the first movable shuttle and the substrate, and a second capacitive sensor formed between the second movable shuttle and the substrate.

A power tool for joining a deformable element having a threaded shaft to a workpiece. The joining tool comprising a threaded dowel adapted to receive the threaded shaft and rotatably within the housing. A nose is arranged around the threaded dowel, and the dowel is slidably movable relative to the nose. A motor drives a drive train to rotate the threaded dowel. A hydraulic system drives another drive train to move the threaded shaft and compress the deformable element. The joining tool includes a sliding unit. The nose is attachable to the sliding unit, and in an attached position the nose is slidably connected to the housing so that the hydraulic system may move the nose axially to compress the deformable element.

The present invention provides an equipment for measuring the vertical distance or pitch between a plurality of thin substrates inside a container body, including an optical component to transmit a light beam to a thin substrate in the container body and receive light beam reflected from the thin substrate, a scanning device to drive the optical component to move along vertical direction of the thin substrates for measuring the vertical distance or pitch between the plurality of thin substrates in the container body, and a rotation base to carry and rotate the container body to a plurality of angles for the plurality of thin substrates inside the container body to be measured from different angular positions.

A Method for X-ray wavelength measurement and an X-ray wavelength measurement apparatus capable of determining absolute wavelength easily and carrying out wavelength measurement having high precision with a simple structure are provided. The present invention is a Method for X-ray wavelength measurement carried out by using a channel-cut crystal for wavelength measurement (20) in which two opposing cut planes are formed and the lattice constant of which is known, and the method diffracts X-ray in respective arrangements (−, +) and (+, −) of the channel-cut crystal for wavelength measurement (20), to determine the absolute wavelength of the X-ray from the difference between crystal rotation angles in respective arrangements. This makes the alignment simpler, and, when only a channel-cut crystal suitable for measurement can be prepared, X-ray wavelength measurement can be carried out easily and with high precision.

A pressure sensor assembly includes a tube, wherein a membrane to which the pressure to be measured is applied is arranged in the cross-section of the tube, where the membrane has a high flexural rigidity in a central region and is mounted resiliently in the edge region in the tube via two limbs, and includes a device for detecting the axial displacement which is easily accessible from the outside on the outer side of the tube and is advantageously not in contact with the process medium, and where the pressure sensor assembly has a particularly simple structural configuration, and can be used advantageously in measurement transducers for process instrumentation.