86 results about "Reflection illumination" patented technology

This invention increases the longevity and performance of solar concentrators, optical switches; and reflection, illumination, and projection equipment in general. To achieve long lifetimes this equipment is sealed to prevent egress of internal lubricant or ingress of undesirable fluids. The rotational elements are sealed to increase their abrasion resistance. Many plastic materials if not sealed as taught in the instant invention are vulnerable to UV degradation, static dust attraction, poor weatherability, and ineffective abrasion resistance resulting in damage in the field and during cleaning. This invention improves the above optical equipment by sealing them with a tough, thin, transparent film. Even in equipment with no internal lubricant, tailored sealants as described in the instant invention can improve the performance of the mirrored elements, Fresnel lenses, and parabolic reflectors. For all the devices, the sealant of the instant invention hardens the surface to prevent scratching, and furthermore can be tailored to be an anti-fogant to keep water vapor off.

Cylindrically curved slopes successively inner-reflect illumination light which reaches a back face or emission face of a light guide plate via an upper edge of an incidence face. The curved slopes give the light diverse propagation directions after inner-reflection. This avoids the viewer from observing a strongly irradiated edge, thereby reducing reflective appearance. Inner-reflection by the curved slopes also gives diverse propagation directions to illumination light coming via other edges, thereby reducing reflective appearance. Curved surface profile is given to valleys involved in a great number of projection rows running in a direction approximately perpendicular to the incidence face, and may be further given to the projection rows. The valleys are provided with curved surface profile within a curved-surface-profile-giving-area around the incidence face or, in addition to this, around flank faces of the light guide plate. The curved surface profile varies gradually around a boundary of the curved-surface-profile-giving-area to avoid sudden profile changing which would bring undesirable effects.

The invention relates to an improving method for a dark spot in an accident at an exit ramp of an expressway based on retro-reflection illumination, wherein ramp grading speed-limit signs are arranged at sight through places in front of the starting point and the nose end of a transition section of a deceleration lane of the exit ramp; a main line single-layer linear induction sign and a ramp double-layer linear induction sign are arranged behind the nose end of the exit ramp; a lane edge line of the exit ramp deviates towards the inner side and reduces the width of a traffic lane, an edge line of a lane at the outer side is set to be a vibration edge line; raised road signs are arranged at the outer sides of a main line and a road edge line of the exit ramp from the end point of the deceleration lane, and a single-side anti-collision bucket is arranged at a guardrail next to the outer side of the ramp from the nose end of the exit ramp, so as to form a high-frequency vision information stream commonly; road-surface lateral deceleration marked lines are arranged in the heading direction of the exit ramp at an interval of 8-12m, so as to form an intermediate-frequency vision information stream commonly with road side linear induction signs; and road side vibration marked lines, anti-collision buckets and the guardrail form road side multi-level protection, and all safety facilities are made of high-strength reflecting materials. The improving method is suitable for realizing the speed limit for a downgrade ramp at an exit of the expressway (40-60km/h).

The invention provides a dedicated automatic rolling riveting fixed machine tool for an oscillating bearing. The machine tool mainly comprises position rough regulating hand wheels in X, Y and Z directions, a working sliding table, an oscillating bearing clamping device, a connecting device of a rolling riveting fixed device, a pressure-torque sensor, an optical ranging machine, a transmission and reflection illumination light source, an optical projection display screen, a load system, a control system and the like. The clamping device adopted by the invention is convenient to assemble and disassemble test pieces, can accurately realize automatic centering and improve the rolling riveting fixed quality of the oscillating bearing; the machine tool can realize the on-line measurement on parameters including rolling riveting pressure, rolling riveting torque, press quantity and the like, has the function of overranging protection, can process the signals and finally generate data, images and curves, and can be beneficial to the preservation and the analysis approach.

An electronic component mounting apparatus which uses a mounting head to hold an electronic component, takes a picture of the electronic component by a line camera (11), processes the image of the electronic component taken by the line camera, and identifies the electronic component by using a recognition unit (16) position, positioning the electronic component on the substrate according to the position recognition result, and mounting the electronic component on the substrate. The pre-stored offset for each identification system with its own light source is used for positioning when correcting the position according to the position of the identification result, wherein the light source is a light source for transmitted illumination (15a) or Light source (15b) for reflected lighting. Even in such an electronic component mounting apparatus that selectively uses a plurality of recognition systems, differences in position recognition results caused by use of other types of lighting methods are corrected to secure necessary component mounting accuracy.

This invention discloses a reflective illumination system for supplying an optical radiation beam along a folded path for illuminating a planar object. The system includes a radiation source, and two facing parabolic dish-shaped arrays of parabolic or dished reflectors. Divergent light received from the light source incident on a first of the arrays is reflected as a larger collimated beam comprising plural separated sub-beams. Each of the reflectors or facets from the first array directs one of the sub-beams to a facet on the second array. The second array reflects the light it receives with a substantially uniform intensity onto a rectangular target location.

The invention relates to a large-format high-speed high-precision automatic optical detector, belongs to the field of automatic optical detection, and solves the problem that the detection precision tends to be influenced by different errors when a mobile small-view-field lens is moved in a present automatic optical detector. The detector comprises a support platform, damping supports, a translation guide rail pair, a workbench on the translation guide rail pair, a transmission illumination light source, a precise driver, a control system, a grating ruler, a lens support, a reflection illumination light source, a reflector, a precise focusing platform, a large-view-field high-precision lens and a splicing detector focal plane assembly. The imaging view field of the large-view-field high-precision lens is greater than 750mm, an imaging focal plane is composed of a triangularly spliced detector array, and part or all spliced detectors are controlled to work in different frame frequencies to match the movement speeds of different workpieces. The large-view-field high-precision lens is combined with the multi-detector spliced focal plane, the problem that a single lens cannot realize large-view-field imaging but multiple lenses are inconsistent in imaging is overcome, and the detection precision and efficiency are improved.

Provided is an inspection apparatus of a wiring pattern that has a small number of false detections and can reduce inspection time by combining an inspection by vertical illumination and that by reflection illumination. A pattern 5a on a TAB tape 5 is carried to an inspection section 1 by a tape conveyance mechanism 10, illumination light is applied from a transmission illumination means 1a, the transmitted illumination image of the pattern 5a is imaged by a CCD line sensor 1c, illumination light is applied from a vertical illumination means 1b, and the vertical illumination image from the pattern 5a is imaged. The captured image is sent to a control section 4. The control section 4 compares the pattern of the transmission illumination image with a first reference pattern, inspects the pattern 5a, compares the pattern of the vertical illumination image at a position corresponding to a faulty section with a second reference pattern regarding the pattern 5a that is determined to be a faulty candidate, and determines whether the pattern 5a is conforming or not.

The invention relates to a self-adaption harmonic wave confocal microscopic measurement method for the illumination of an ellipsoidal reflector, belonging to the non-linear optical measurement. According to the method, an ellipsoidal reflection illumination system, a confocal microscopic measurement method, a self-adaption optical aberration correction method and a harmonic wave microscopic methodare organically combined, so that the harmonic wave microscopic measurement resolving power can be improved. A femtosecond laser pulse is subjected to beam shaping and scanning galvanometer reflection, enters the self-adaption optical aberration correction method and is subjected to phase modulation and aberration correction to generate illumination beams, and the illumination beams enter an ellipsoidal reflection mirror system and are assembled into a sample so as to generate stimulation focus light spots required by the generation of harmonic signals. The sample is stimulated by stimulationlight to simultaneously generate second and third harmonic signal, and the second and third harmonic signals are collected and analyzed by a double-path composited confocal microscopic measurement system on the right side. After being collected by a large-numerical aperture objective lens, the harmonic signals are separated into two wavelength signals by a bidirectional color selective mirror, are focused by a narrow band pass filter and an imaging objective lens, are transmitted through a needle hole and are received by a photomultiplier (PMT). An adopted harmonic wave collection module adopts a confocal collection mode. By virtue of an apodization effect of a confocal needle hole, the interference caused by aliasing signal noise to the analysis of the harmonic signals can be effectivelyinhibited, and the measurement resolving power of the microscopic system can be greatly improved.

The invention provides an illumination data prediction method and system based on a neural network, a terminal and a medium. The method comprises the steps: collecting the image data of an object under illumination based on different visual angles, so as to construct a multi-dimensional geometric model of the object; capturing a plurality of groups of sampling data based on the multi-dimensional geometric model to serve as training data for training a neural network model; wherein the neural network model is used for predicting reflected illumination data of the object at any visual angle. According to the technical scheme provided by the invention, the neural network used for predicting the illumination data is established based on the sampling data, and the reflection illumination data under any visual angle is predicted through the neural network, so that the high-fidelity rendering image is obtained, Meanwhile, a very high rendering compression ratio and high efficiency of real-time rendering can be achieved.

The present invention provides a film thickness unevenness inspection device and method capable of acquiring an image with brightness and contrast suitable for inspection, so as to obtain an accurate inspection result. The present invention discloses a film thickness unevenness inspection device and method, characterized in moving a substrate with a surface formed thereon a coating film along a direction and, at the same time, inspecting film thickness unevenness of the coating film formed on the substrate. A film thickness inspection portion is provided for inspecting a thickness of the coating film. A light source portion comprises a reflection illumination portion installed in one side of an image capturing portion, and a transmission illumination portion installed in a location opposite to the image capturing portion with the substrate installed in-between. The image capturing portion comprises an image capturing portion angle adjustment mechanism for adjusting a relative angle with respect to the substrate. The reflection illumination portion comprises a reflection illumination angle adjustment mechanism for adjusting a relative angle between the reflection illumination portion and the substrate. The transmission illumination portion comprises a transmission illumination angle adjustment mechanism for adjusting a relative angle between the transmission illumination portion and the substrate. The film thickness unevenness inspection device comprises a control portion. According to film thickness information from the film thickness inspection portion, the control portion controls the reflection illumination angle adjustment mechanism and the transmission illumination angle adjustment mechanism to regulate a light quantity of reflection illumination and a light quantity of transmission illumination.

An illumination device according to the present invention includes a light output unit having an output end that outputs illumination light; a diffusion layer that is disposed in a circumferential direction centered on a predetermined axis and that receives the illumination light from the output end, guides the illumination light while diffusing the illumination light, and outputs the illumination light from a surface thereof; and a reflective layer that is provided adjacent to a surface of the diffusion layer at an inner side in a radial direction and that reflects the illumination light outward in the radial direction. The diffusion layer contains a light guide material that guides the illumination light and a diffusion material dispersed and supported in the light guide material.

The invention discloses a method of quickly counting surface contaminations and damages of a large-caliber optical component. The method comprises the following steps: S1, the large-caliber optical component is placed in a darkroom; S2, a total-reflection illumination module is started and adjusted to enable light to be incident on the surface of the large-caliber optical component with a total reflection angle; S3, an image acquisition system is used for image acquisition on the surface of the large-caliber optical component; S4, the total-reflection illumination module is closed; S5, a low-angle incident illumination module is started and adjusted; and S6, the image acquisition system is used for image acquisition on the surface of the large-caliber optical component. By adopting the above method, a complicated process is avoided, quick discrimination and counting of the surface contaminations and damages of the large-caliber optical component can be realized simply, efficiently, andintuitively, and the problem that contaminations and damages can not be counted at the same time in the prior art can be solved.