The invention discloses a method for quantitatively examining the center segregation of a wire rod. The method comprises the following steps: taking two wire rod samples, rubbing down the cross section of one of the wire rod samples, splitting the other sample at the 2 / 3 position along the vertical direction of the wire rod sample, rubbing down the profile of the lager sample, putting the two rubbed surfaces next to each other in a same plane, inlaying through using a conductive resin, grinding the samples, polishing the plane when the width of the vertical profile of the wire rod sample is equal to the diameter of the other wire rod sample, and corroding the samples through using an alcohol solution of nitric acid; marking through drawing a line at the severest segregation position, and polishing the samples; and putting the samples in an electronic probe analyzer, finding the made mark through using a secondary electron image, carrying out C and Mn element X-ray intensity line analysis measurement of the full width of the samples through utilizing element characteristic X-ray spectrum analysis under an acceleration voltage of 10-20kV, an electron beam current of above 100nA and a beam spot dimension of 20-50mum, recording through using curves, testing the X-ray intensities of a standard sample of the analytic elements under same test conditions, converting the X-ray intensities in the curves into concentration contents, obtaining maximum concentrations and average concentrations from the curves, and obtaining the center segregation rates through calculating according to a formula of the center segregation rate=(the maximum value / the average value)*100%.