The invention discloses a method and
system for measuring a polarization state of a sample based on a polarization
beam splitting prism. After light emitted by a
laser device is aligned through an alignment device, the light is split into two beams through a non-polarization
beam splitting prism, wherein one beam of light penetrates through a sample or carries sample information after being reflected by the sample and is used as an object
light beam; the other beam of light is used as a reference
light beam; the two beams of light are reflected through a reflecting mirror and then are converged through the non-polarization
beam splitting prism. The polarization beam splitting prism is rotated so that the reference
light beam is divided into two beams of
linearly polarized light, which havebasically equal
light intensity and crossed polarization directions, after passing through the polarization beam splitting prism. After the reference light beam and the object light beam pass throughthe polarization beam splitting prism, two interference patterns with orthogonal polarization states are formed. Two holograms are recorded by utilizing a camera. A computer is used for further carrying out numerical value reconstruction on complete unification positions and corresponding pixel points of the sample in the two holograms; finally, corresponding amplitude and phase information of anobject
light wave field is finally obtained; the information is processed by the computer to obtain polarization state information of the sample. Compared with utilization of a traditional Mueller
microscope, a condition that a plurality of times of acquisition are influenced by the environment is avoided and the stability and the real-time measurement capability of the
system are improved.