The invention relates to a reflection type time-of-flight
mass spectrometer with a quality filtering function. The reflection type time-of-flight
mass spectrometer comprises an
ion reflection
electrode which a
pulse voltage is applied to. The reflection type time-of-flight
mass spectrometer also comprises a vacuum cavity, an
ion source, an
ion lead-out
electrode, an acceleration zone, a field-
free flight zone, a reflector and an MCP ion
detector. The method for realizing quality filtering by use of the time-of-flight mass spectrometer comprises the following steps: before irons whose mass-to-charge ratio needs to be filtered passes through an ion deceleration
electrode and reaches the ion reflection electrode, the
pulse voltage with a certain pulse width and amplitude is applied to the ion reflection electrode, the ions whose mass-to-charge ratio needs to be filtered are totally or partially sprayed on the ion reflection electrode and are lost, and other ions are reflected back to the field-
free flight zone and is detected by the MCP ion
detector. The reflection type time-of-flight mass spectrometer is provided with the quantity filtering function. By using the reflection type time-of-flight mass spectrometer and the method, the accuracy in measuring field weak signals can be effectively improved, the instrument dynamic scope is increased, irons of several mass-to-charge ratios can be selectively detected, the
background noise is reduced, and the instrument detection sensitivity is improved.