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Ion mass screening device in flight time mass spectrometry

A technology of time-of-flight mass spectrometry and ion mass, which is applied in the field of ion mass screening devices, can solve problems such as high background noise, affecting weak ion signal detection, and affecting the service life of MCP ion detectors, so as to reduce background noise, improve dynamic range, Effects of Improving Mass Spectrometry Resolution

Active Publication Date: 2020-06-02
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

However, since TOFMS does not have the mass screening capability of quadrupole mass spectrometer and ion trap mass spectrometer, all ions will be received, amplified and output by the Micro Channel Plate (MCP) ion detector, which will easily cause MCP ion The saturation of the detector not only affects the detection of weak ion signals and generates high background noise, but also affects the service life of the MCP ion detector

Method used

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  • Ion mass screening device in flight time mass spectrometry
  • Ion mass screening device in flight time mass spectrometry

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Embodiment 1

[0036] See figure 2 shown. One of the ion mass screening electrodes of the present invention comprises three plate-shaped electrodes and an ion mass screening device with a pulse voltage U1 amplitude of 0V. When the negatively charged ions R that need to be filtered reach the ion quality screening electrode 4, a pulse voltage U1 is applied to the first and third plate structure electrodes in the ion mass screening electrode 4, and the second plate structure electrode Apply pulse voltage U2. Among them, the amplitude of U1 is 0V; U2 is a negative pulse, and its amplitude is 2000V. Then, under the action of the ion deflection electric field between the plate structure electrodes of the ion mass screening electrode 4 , the ion R with the mass-to-charge ratio deflects its flight path and deviates along the upper and lower sides of the microchannel plate 5 respectively. When the ions M of the required detection mass-to-charge ratio arrive at the ion mass screening electrode 4, ...

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Abstract

The invention relates to a mass spectrometry instrument, in particular to an ion mass screening device in flight time mass spectrometry, and the device comprises a mass analyzer; the mass analyzer comprises a vacuum cavity, a field-free flying area located in the vacuum cavity, a grid electrode, a micro-channel plate and a Faraday disk; an ion mass screening electrode is arranged in an area between the two metal grid meshes of the grid mesh electrode; pulse voltages U1 and U2 which are opposite in polarity, identical in pulse width and synchronous in time sequence are applied to all the adjacent plate-type structure electrodes of the ion mass screening electrode respectively. According to the invention, the ion mass reaching the micro-channel plate ion detector can be selectively filtered;the interference of high-strength ion background ions and reaction reagent ions on the micro-channel plate detector is eliminated, the dynamic range of an instrument can be effectively enlarged, thedetection sensitivity is improved, and the service life of the micro-channel plate ion detector can be greatly prolonged.

Description

technical field [0001] The invention relates to a mass spectrometry instrument, in particular to a time-of-flight mass analyzer, in particular to an ion mass screening device in a time-of-flight mass spectrometer. Background technique [0002] Time-of-Flight Mass Spectrometer (TOFMS) is a commonly used mass spectrometry technique, which determines the The mass-to-charge ratio can be used to realize the qualitative analysis of the analyte. TOFMS has simple structure, high resolution and sensitivity, wide mass range, and has microsecond-level fast response speed and full-spectrum simultaneous measurement capability. Therefore, it is widely used in ecological environment, life and health, material science, biomedicine, process analysis, etc. field has been widely used. In the detection process of actual samples, when TOFMS uses chemical ionization (Chemical Ionization, CI) source, electron impact ionization (Electron Ionization, EI) source, inductively coupled plasma ionizati...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/40
CPCH01J49/40
Inventor 花磊陈平李庆运李海洋
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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