Reflection type time-of-flight mass spectrometer with quality filtering function, and use method thereof

Abstract

The invention relates to a reflection type time-of-flight mass spectrometer with a quality filtering function. The reflection type time-of-flight mass spectrometer comprises an ion reflection electrode which a pulse voltage is applied to. The reflection type time-of-flight mass spectrometer also comprises a vacuum cavity, an ion source, an ion lead-out electrode, an acceleration zone, a field-free flight zone, a reflector and an MCP ion detector. The method for realizing quality filtering by use of the time-of-flight mass spectrometer comprises the following steps: before irons whose mass-to-charge ratio needs to be filtered passes through an ion deceleration electrode and reaches the ion reflection electrode, the pulse voltage with a certain pulse width and amplitude is applied to the ion reflection electrode, the ions whose mass-to-charge ratio needs to be filtered are totally or partially sprayed on the ion reflection electrode and are lost, and other ions are reflected back to the field-free flight zone and is detected by the MCP ion detector. The reflection type time-of-flight mass spectrometer is provided with the quantity filtering function. By using the reflection type time-of-flight mass spectrometer and the method, the accuracy in measuring field weak signals can be effectively improved, the instrument dynamic scope is increased, irons of several mass-to-charge ratios can be selectively detected, the background noise is reduced, and the instrument detection sensitivity is improved.

Description

technical field [0001] The invention relates to a mass spectrometer analysis instrument, in particular to a reflective time-of-flight mass spectrometer with mass filtering function and its use method. Background technique [0002] Time-of-Flight Mass Spectrometer (TOFMS) determines its mass-to-charge ratio by recording the flight time of different ions with the same energy reaching the detector. It has a simple structure, fast analysis speed, high resolution and sensitivity. With microsecond-level fast response speed and full-spectrum simultaneous measurement capability, it has received extensive attention in the fields of process analysis, environmental detection, material science, biomedicine, and life science. However, in practical applications, on the one hand, the samples to be analyzed are usually relatively complex, and the contents of different components often have several orders of magnitude differences, which will cause a large difference in the ion signals of dif...

AI Technical Summary

Problems solved by technology

However, in practical applications, on the one hand, the samples to be analyzed are usually relatively complex, and the contents of different components often have several orders of magnitude differences, which will cause large differences in the ion signals of different components; on the other hand, when flying When the time-based mass spectrometer uses electron bombardment ionization sources, glow discharge ionization sources, chemical ionization sources, etc. as ion sources, it will generate very strong ion signals of background molecules or ion signals of reaction reagents.

Because traditional time-of-flight mass spectrometers do not have the mass filtering function of quadrupole mass spectrometers and ion trap mass spectrometers, in these two cases, strong ion signals will not only saturate the MCP (MicroChannelPlate) ion detector, but also affect weak signals Therefore, there will be measurement errors for both strong and weak signals, which will reduce the dynamic range of the instrument, and will also generate high background noise, which will reduce the detection sensitivity of the instrument.

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