1057 results about "Electrical measurements" patented technology
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Electrical measurements are the methods, devices and calculations used to measure electrical quantities. Measurement of electrical quantities may be done to measure electrical parameters of a system. Using transducers, physical properties such as temperature, pressure, flow, force, and many others can be converted into electrical signals, which can then be conveniently measured and recorded. High-precision laboratory measurements of electrical quantities are used in experiments to determine fundamental physical properties such as the charge of the electron or the speed of light, and in the definition of the units for electrical measurements, with precision in some cases on the order of a few parts per million. Less precise measurements are required every day in industrial practice. Electrical measurements are a branch of the science of metrology.
Implantable in vivo sensors used to monitor physical, chemical or electrical parameters within a body. The in vivo sensors are integral with an implantable medical device and are responsive to externally or internally applied energy. Upon application of energy, the sensors undergo a phase change in at least part of the material of the device which is then detected external to the body by conventional techniques such as radiography, ultrasound imaging, magnetic resonance imaging, radio frequency imaging or the like. The in vivo sensors of the present invention may be employed to provide volumetric measurements, flow rate measurements, pressure measurements, electrical measurements, biochemical measurements, temperature, measurements, or measure the degree and type of deposits within the lumen of an endoluminal implant, such as a stent or other type of endoluminal conduit. The in vivo sensors may also be used therapeutically to modulate mechanical and / or physical properties of the endoluminal implant in response to the sensed or monitored parameter.
An electrical monitor comprising a via array and method for determining and reducing an electrically charged state of a semiconductor process wafer the method including providing a metal filled via array including a plurality of interspersed electrically isolated dummy metal portions to form a via array monitor; exposing the semiconductor process wafer including the via array monitor to an electrical charge altering process including to produce an electrically charged state over at least a portion of the semiconductorwafer; carrying out electrical measurements of the via array monitor to determine a level of the electrically charged state; and, carrying out an electrically charge neutralizing process to reduce a level of the electrically charged state to a predetermined acceptable level prior to carrying out a subsequent process.
The invention discloses an intelligent mobile terminal and a temperature control method during charging of the intelligent mobile terminal. The intelligent mobile terminal comprises batteries, a charging module, a temperature sensor, an electric quantity measurement module and a processor, wherein the charging module is used for charging the batteries, the temperature sensor is used for acquiring the temperature of the intelligent mobile terminal, the electric quantity measurement module is used for measuring the electric quantity of the batteries, and the processor is used for controlling magnitudes of charging currents of the charging module according to the temperature when the temperature is smaller than the preset largest operating temperature threshold value and controlling magnitudes of charging currents of the charging module according to the electric quantity when the temperature is larger than or equal to the preset largest operating temperature threshold value. Accordingly, the temperature of the intelligent mobile terminal can be controlled within the preset range by controlling the magnitudes of charging currents, and performance of the intelligent mobile terminal is ensured.
Techniques for surface exploration and monitoring are presented. In representative embodiments, a system is provided that can perform multiple types of measurements of a surface. For example a single system of survey probes and one or more survey controllers can be used to offer both seismic and electrical measurements. A survey controller can be configured to automatically poll survey probes to obtain identifiers of the probes and determine a relative order the probes. Survey probes can be configured to: (a) collect signals associated with a surface; (b) digitize the signals to form digital data; and (c) store the digital data for later transmission to the survey controller. Relative positions of survey probes can be automatically determined using a transmitting beacon or other techniques. Survey probes can automatically disconnect from a power conduit while measuring a surface property and operate using an internal source of power when disconnected, to reduce noise. The survey controller can be remotely accessible through a computer network for remote control of the survey probes.