The invention provides a test method and a test
system for an LED
wafer. The test
system includes a standard spot-test
machine, an LED
wafer scintigram template unit, a standard spot-test
machine scintigram template setting unit, a standard spot-test
machine cover-die test unit, a spot-test standard
data file unit, a to-be-tested LED
wafer correction function unit, a monitoring unit and an analyzing
processing unit, which are connected sequentially. A Mapping full-test machine, the LED wafer scintigram template unit, a Mapping full-test machine scintigram template setting unit, a Mapping full-test cover machine cover-die test unit and a Mapping full-
test data temporary file unit, which are sequentially connected, are connected with a Mapping full-
test data standard file unit sequentially. The Mapping full-test machine cover-die test unit is connected with the to-be-tested LED wafer correction function unit through a spot-test grain Mapping
data file unit. The monitoring unit is connected with the Mapping full-
test data standard file unit. The test method and test
system for the LED wafer derates personnel and material costs related with Mapping full-test machine correction and monitoring and at the same time, improves machine productivity use rate and reduces the manufacturing cost of the LED wafer.