152 results about "Aperture plane" patented technology

A projection exposure apparatus for microlithography has a light source, an illumination system, a mask-positioning system and a projection lens. The latter has a system aperture plane and an image plane and contains at least one lens that is made of a material which has a birefringence dependent on the transmission angle. The exposure apparatus further has an optical element, which has a position-dependent polarization-rotating effect or a position-dependent birefringence. This element, which is provided close to a pupil plane of the projection exposure apparatus, compensates at least partially for the birefringent effects produced in the image plane by the at least one lens.

An adjustable multimode lightfield imaging system. A non-homogeneous filter module is positioned at the aperture plane of the lightfield imaging system and provides the multimode capability. The filter module can be moved relative to the imaging system, thus allowing adjustment of the multimode capability.

An insulating panel attachable to a building, the building defining a building aperture, the building aperture defining an aperture plane extending substantially thereacross. The insulating panel includes a membrane structure defining a first external wall and a substantially opposed second external wall; a peripheral wall extending between the first and second external walls, the first external wall, second external wall and peripheral wall together defining an enclosure; and an internal wall system located between the first and second external walls, the internal wall system being configured so as to divide the enclosure into a first cell located substantially adjacent to the first external wall and a second cell located substantially adjacent to the second external wall, the first and second cells being substantially spaced apart respectively from the second and first external walls by the internal wall system. A frame is attachable to the building, the frame being operatively coupled to the membrane structure for maintaining the first external wall substantially parallel to the aperture plane and substantially in register with at least a portion of the building aperture when the frame is attached to the building.

A antenna system for generating and distributing power among a plurality of non-focused beams is provided The system comprises a reflector having a focal plane and a non-parabolic curvature configured to form the defocused beams. The curvature is configured to create a symmetrical quadratic phase-front in an aperture plane of the reflector. The system further comprises a plurality of feed antennas disposed in the focal plane of the reflector and configured to illuminate the reflector. Each feed antenna is configured to contribute power toward each of the defocused beams. The system further comprises a plurality of fixed-amplitude amplifiers, at least one of which corresponds to each feed antenna.

New methods for phase contrast imaging in transmission electron microscopy use the imaging electron beam itself to prepare a hole-free thin film for use as an effective phase plate, in some cases eliminating the need for ex-situ fabrication of a hole and reducing requirements for the precision of the ZPP hardware. The electron optical properties of the ZPP hardware are modified primarily in two ways: by boring a hole using the electron beam; and / or by modifying the electro-optical properties by charging induced by the primary beam. Furthermore a method where the sample is focused by a lens downstream from the ZPP hardware is disclosed. A method for transferring a back focal plane of the objective lens to a selected area aperture plane and any plane conjugated with the back focal plane of the objective lens is also provided.

The present invention relates to an incident illumination device(5) for a microscope (100), comprising a light source (11) that includes at least two light-emitting segments and is imaged into an aperture plane (AE) of the incident illumination device (5). At least one of the at least two light-emitting segments of the light source (11) is designed to be activated individually. The described microscope and methods of use thereof allow also to select between angular or oblique incident illumination.

A method and apparatus for correcting aberrations using a Ronchigram. A STEM apparatus has first calculation means for taking autocorrelation of minute regions on a Ronchigram of an amorphous specimen, detection device for detecting aberrations in the beam formed from local angular regions on an aperture plane from the autocorrelation or from Fourier analysis of the autocorrelation, second calculation device for calculating the aberrations based on the results of the detection, and control device for controlling operation for correcting the aberrations based on results of calculations performed by the second calculation device.

This invention uses a real-time holographic medium to record the amplitude and phase information collected from a moving platform at the aperture plane of a side-looking optical sensor over the collection time. A back-scan mirror is used to compensate platform motion during the synthetic aperture integration time. Phase errors caused by a nonlinear platform motion are compensated by controlling the phase offset between the illumination beam and the reference beam used to write the hologram based on inertial measurements of the flight path and the sensor line-of-sight pointing angles. In the illustrative embodiment, a synthetic aperture ladar (SAL) imaging system is mounted on a mobile platform. The system is adapted to receive a beam of electromagnetic energy; record the intensity and phase pattern carried by the beam; and store the pattern to compensate for motion of the platform relative to an external reference. In the illustrative embodiment, the image is stored as a holographic image. The system includes a back-scan mirror, which compensates the stored holographic pattern for motion of the platform. The medium and back-scan mirror may be replaced with a digital camera and one-dimensional and two-dimensional arrays may be used. In a specific embodiment, a two-dimensional array is used with a time delay and integration (TDI) scheme, which compensates for motion of the platform in the storage of the optical signals. In an alternative embodiment, a back-scanning mirror is used to compensate for motion of the platform. Consequently, the interference pattern between a relayed image of the aperture plane and a reference beam is continuously stored. In this embodiment, the instantaneous location of the received beam on the recording medium is controlled to compensate for motion of the platform.