43results about How to "Avoid changing situations" patented technology

The invention provides an in-situ stretching device for X-ray test, which comprises: a frame body, the frame body has a connection structure, and the connection structure can be fixedly connected with the test bench of the detection equipment; the stretching mechanism is arranged on the frame body Above: the clamping mechanism, including two clamping modules arranged symmetrically along the length direction, the two clamping modules are used to clamp the two ends of the test piece, the test piece has a test surface, and the test surface is located on the surface of the two clamping modules , the stretching mechanism is drivingly connected with the two clamping modules, so that the two clamping modules move towards each other or reversely synchronously, and the clamping module is detachably connected with the stretching mechanism. Through the technical scheme provided by the invention, the problems of complicated operation and poor test result accuracy in the prior art can be solved.

The invention provides a data reading method of a split gate type double-bit memory cell flash memory. A traditional manner of taking a current of a reference cell under a state of ''11'' as a read judgment standard is changed into a pattern of taking a current of the reference cell under a state of ''10'' multiplied by a fixed proportion as the read judgment standard, so that the sensing margin can be guaranteed and the reliability of data reading of the split gate type double-bit memory cell flash memory can be improved; yield loss caused by programming performance differences between differentlots can be avoided by means of calculating a current average value of a plurality of reference cells; further, after the split gate type double-bit memory cell flash memory is erased by block every time and before a new round of data reading is carried out, each reference cell is re-programmed, and each reference cell is reset to be the state of ''10'', so that the condition that the current value of the reference cell under the state of ''10'' is affected and changed due to the programming strongaftererasure by block can be avoided, and the reliability of data reading of the split gate type double-bit memory cell flash memory can be further improved.

The invention discloses a fault location method and system for a distribution network with a high-permeability distributed power supply. The method includes: S1: when a fault occurs in a distribution network with a high-permeability distributed power supply, the grid power detection point and The distributed power grid-connected point detects the sudden change and collects the A, B, and C three-phase current and voltage of the current transformer and voltage transformer at the grid power detection point and the distributed power grid-connected point; S2: Thevenin equivalent of the distributed power , calculate the positive sequence, negative sequence, zero sequence Thevenin equivalent impedance of the distributed power supply, and then establish the bus impedance matrix; S3: construct the fault index to identify the fault interval; S4: construct the virtual bus to locate the fault point. The invention performs normalization processing on distributed power sources, establishes models suitable for various types of distributed power sources, and ensures that the established busbar impedance matrix has nothing to do with the types of distributed power sources.