405 results about "Junction diodes" patented technology

Junction diodes or MOS devices fabricated in standard FinFET technologies can be used as program selectors or One-Time Programmable (OTP) element in a programmable resistive device, such as interconnect fuse, contact / via fuse, anti-fuse, or emerging nonvolatile memory such as MRAM, PCRAM, CBRAM, or RRAM. The MOS or diode can be built on at least one fin structure or at least one active region that has at least one first active region and a second active region. The first and the second active regions can be isolated by a dummy MOS gate or silicide block layer (SBL) to construct a diode.

A memory cell is described suitable for use in a high-density monolithic three dimensional memory array. In preferred embodiments of the memory cell, a semiconductor junction diode formed of germanium or a germanium alloy which can be crystallized at relatively low temperature is formed disposed between conductors. The use of a low-temperature material allows the conductors to be formed of copper or aluminum, both low-resistivity materials that provide adequate current at very small feature size, allowing for a highly dense stacked array.

A nonvolatile semiconductor storage device is provided in which memory cells comprising PN junction diodes having satisfactory rectifying characteristics are arranged in three dimensions. The semiconductor storage device includes: a first wire which extends in one direction; a second wire which extends in a direction intersecting the first wire; and a memory cell which is positioned at a portion of intersection of the first wire with the second wire between the first wire and the second wire, the memory cell comprising a storage element and a PN junction diode connected thereto, positioned on a side of the second wire used in selecting the memory cell, and a P-type semiconductor forming the PN junction diode forms a portion of the second wire, wherein a plurality of structures, each structure comprising the first wire, the second wire, and the memory cell is provided three-dimensionally.

A preamplifier having extremely high input impedance amplifies the electrical signal output from an electret condenser microphone (ECM) without suffering from the effects of a DC leakage current at the input. The preamplifier circuit includes a pair of cross-coupled PN junction diodes setting the input impedance, a PMOS device, and a load resistor configured similarly to a conventional preamplifier. A capacitor is placed between the input and the cross-coupled diodes such that a DC path no longer exists to bias the cross-coupled diodes. Therefore, leakage currents are prevented from upsetting the DC operating point of the preamplifier and biasing the cross-coupled diodes. Consequently, small signal gain distortion, excessive demodulation products and increased noise can be avoided.

At least one junction diode fabricated in standard CMOS logic processes can be used as program selectors for the memory cells that can be programmed based on the directions of current flow. These memory cells are MRAM, RRAM, CBRAM, or other memory cells that have a resistive element coupled to the P terminal of the first diode and to the N terminal of a second diode. The diodes can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diodes. By applying a high voltage to a resistive element and switching the N terminal of the first diode to a low voltage while disabling the second diode, a current flows through the memory cell can change the resistance into one state. Similarly, by applying a low voltage to a resistive element and switching the P terminal of the second diode to a high voltage while disabling the first diode, a current flows through the memory cell can change the resistance into another state. The P+ active region of the diode can be isolated from the N+ active region in an N well by using dummy MOS gate, SBL, or STI isolations.

A memory compiler to generate a set of memories is based on a subtraction approach from a set of templates (memory templates), including at least one layout database and auxiliary design databases, by software. The software can be based on general-purpose programming language or a layout-specific language. The compiled memories can be generated by reducing the memory array sizes in row and / or column directions by moving, deleting, adding, sizing, or stretching the layout objects, and disabling the high order addresses, etc. from the memory template by software. The new auxiliary design databases, such as layout phantom, behavior model, synthesis view, placement-and-routing view or datasheet, can also be generated by modifying some parameters from the memory template by software. One-time programmable memory using junction diode, polysilicon diode, or isolated active-region diode as program selector in a cell can be generated accordingly.

Provided are a non-volatile memory device that may be configured in a stacked structure and may be more easily highly integrated, and a method of fabricating the non-volatile memory device. At least one first electrode and at least one second electrode are provided. The at least one second electrode may cross the at least one first electrode. At least one data storage layer may be at an intersection between the at least one first electrode and the at least one second electrode. Any one of the at least one first electrode and the at least one second electrode may include at least one junction diode connected to the at least one data storage layer.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuse, contact / via fuse, contact / via anti-fuse, or gate-oxide breakdown anti-fuse, etc. The OTP device has at least one OTP element coupled to at least one diode in a memory cell. The diode can be constructed by P+ and N+ active regions in a CMOS N well, or on an isolated active region as the P and N terminals of the diode. The isolation between P+ and the N+ active regions of the diode in a cell or between cells can be provided by dummy MOS gate, SBL, or STI / LOCOS isolations. The OTP element can be polysilicon, silicided polysilicon, silicide, metal, metal alloy, local interconnect, thermally isolated active region, CMOS gate, or combination thereof.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for reversible resistive memory cells that can be programmed based on magnitude, duration, voltage-limit, or current-limit of a supply voltage or current. These cells are PCM, RRAM, CBRAM, or other memory cells that have a reversible resistive element coupled to a diode. The diode can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diode. The memory cells can be used to construct a two-dimensional memory array with the N terminals of the diodes in a row connected as a wordline and the reversible resistive elements in a column connected as a bitline. By applying a voltage or a current to a selected bitline and to a selected wordline to turn on the diode, a selected cell can be programmed into different states reversibly based on magnitude, duration, voltage-limit, or current-limit. The data in the reversible resistive memory can also be read by turning on a selected wordline to couple a selected bitline to a sense amplifier. The wordlines may have high-resistivity local wordlines coupled to low-resistive global wordlines through conductive contact(s) or via(s).

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for reversible resistive devices, such as PCM, RRAM, CBRAM, or other memory cells. The reversible resistive devices have a reversible resistive element coupled to a diode. The diode can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diode. By applying a voltage or a current between a reversible resistive element and the N terminal of a diode, the reversible resistive device can be programmed into different states based on magnitude, duration, voltage-limit, or current-limit in a reversible manner. The P+ active region of the diode can be isolated from the N+ active region in the N well by using dummy MOS gate, SBL, or STI / LOCOS isolations.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuse, contact / via fuse, contact / via anti-fuse, or gate-oxide breakdown anti-fuse, etc. The OTP device has an OTP element coupled to a diode in a memory cell. The diode can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diode. By applying a high voltage to the P terminal of a diode and switching the N terminal of a diode to a low voltage for suitable duration of time, a current flows through an OTP element in series with the program selector may change the resistance state. The P+ active region of the diode can be isolated from the N+ active region in the N well by using dummy MOS gate, SBL, or STI / LOCOS isolations. If the resistive element is an interconnect fuse based on CMOS gate material, the resistive element can be coupled to the P+ active region by an abutted contact such that the element, active region, and metal are connected in a single rectangular contact.

At least one junction diode fabricated in standard CMOS logic processes can be used as program selectors for memory cells that can be programmed based on direction of current flow. These cells are MRAM, RRAM, CBRAM, or other memory cells that have a programmable resistive element coupled to a P terminal of a first diode and to an N terminal of a second diode. The diodes can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diodes. The memory cells can be used to construct a two-dimensional memory array with the N terminals of the first diodes and the P terminals of the second diodes in a row connected as wordline(s) and the resistive elements in a column connected as a bitline. By applying a high voltage to a selected bitline and a low voltage to a selected wordline to turn on the first diode while disabling the second diode, a selected cell can be programmed into one state. Similarly, by applying a low voltage to a selected bitline and a high voltage to a selected wordline to turn on the second diode while disabling the first diode, a selected cell can be programmed into another state. The data in the resistive memory cell can also be read by turning on a selected wordline to couple a selected bitline to a sense amplifier. The wordlines may have high-resistivity local wordlines coupled to low-resistivity global wordlines through conductive contact(s) or via(s).

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuse, contact / via fuse, contact / via anti-fuse, or gate-oxide breakdown anti-fuse, etc. The diode can be constructed by P+ and N+ active regions on an N well as the P and N terminals of the diode. The OTP device has an OTP element coupled to the diode. The OTP device can be used to construct a two-dimensional OTP memory with the N terminals of the diodes in a row connected as a wordline and the OTP elements in a column connected as a bitline. By applying a high voltage between a selected bitline and a selected wordline to turn on a diode in a selected cell for suitable duration of time, a current flows through an OTP element in series with the program selector may change the resistance state. The cell data in the OTP memory can also be read by turning on a selected wordline and to couple a selected bitline to a sense amplifier. The wordlines may have high-resistivity local wordlines coupled to low-resistivity global wordlines through conductive contact(s) or via(s).

Electro-Static Discharge (ESD) protection using at least one ring-shape diode is disclosed. The ring-shape diode can be constructed from polysilicon, active region body on insulated substrate, or junction diode on silicon substrate. The diodes can have a first type of implant in an outer ring and a second type of implant in an inner ring to serve as two terminals of a diode coupled through contacts, vias, or metals. The two types of implant ring regions are separated with an isolation structure. The isolation can be LOCOS, STI, dummy gate, or silicide block layer (SBL). The ESD structure has at least a ring-shape diode with a first terminal coupled to an I / O pad and the second terminal coupled to a first supply voltage. The contours of the ring-shape diode can be circles, polygons, or other shapes. The ring-shape ESD structures can be multiple and be constructed in concentric manner.

Embodiments of the invention generally relate to the field of semiconductor devices, and more specifically to fin-based junction diodes. A portion of a doped semiconductor fin may protrude through a first doped layer. An intrinsic layer may be disposed on the protruding semiconductor fin. A second semiconductor layer may be disposed on the intrinsic layer, thereby forming a PIN diode compatible with FinFET technology and having increased junction area.

A semiconductor power device supported on a semiconductor substrate of a first conductivity type with a bottom layer functioning as a bottom electrode and an epitaxial layer overlying the bottom layer with a same conductivity type as the bottom layer. The semiconductor power device includes a plurality of FET cells and each cell further includes a body region of a second conductivity type extending from a top surface into the epitaxial layer. The body region encompasses a heavy body dopant region of second conductivity type. An insulated gate is disposed on the top surface of the epitaxial layer, overlapping a first portion of the body region. A barrier control layer is disposed on the top surface of the epitaxial layer next to the body region away from the insulated gate. A conductive layer overlies the top surface of the epitaxial layer covering a second portion of the body region and the heavy body dopant region extending over the barrier control layer forming a Schottky junction diode.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuse, contact / via fuse, contact / via anti-fuse, or gate-oxide breakdown anti-fuse, etc. The OTP device has at least one OTP element coupled to at least one diode in a memory cell. The diode can be constructed by P+ and N+ active regions in a CMOS N well, or on an isolated active region as the P and N terminals of the diode. The isolation between P+ and the N+ active regions of the diode in a cell or between cells can be provided by dummy MOS gate, SBL, or STI / LOCOS isolations. The OTP cell can have a MOS in series with the OTP element as a read selector. The OTP element can be polysilicon, silicided polysilicon, silicide, polymetal, metal-0, metal, metal alloy, local interconnect, thermally isolated active region, CMOS gate, or combination thereof.

An ETSOI transistor and a combination of capacitors, junction diodes, bank end contacts and resistors are respectively formed in a transistor and capacitor region thereof by etching through an ETSOI and BOX layers in a replacement gate HK / MG flow. The capacitor and other devices formation are compatible with an ETSOI replacement gate CMOS flow. A low resistance capacitor electrode makes it possible to obtain a high quality capacitor, and devices. The lack of topography during dummy gate patterning are achieved by lithography in combination accompanied with appropriate etch.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices. An OTP device can have at least one OTP element coupled to at least one diode in a memory cell. With a metal fuse is used by the OTP element, at least one contact and / or a plurality of vias can be built (possibly with use of one or more jumpers) in the program path to generate more Joule heat to assist with programming. The jumpers are conductive and can be formed of metal, metal gate, local interconnect, polymetal, etc. The metal fuse can also have an extended area that is longer than required by design rules for enhanced programmability. The OTP element can be polysilicon, silicided polysilicon, silicide, polymetal, metal, metal alloy, local interconnect, thermally isolated active region, CMOS gate, or combination thereof.

The invention discloses a semiconductor photosensitization device which comprises a source electrode, a drain electrode, a control grid, a floating grate region, a substrate, and a p-n node diode for connecting a floating gate region and a drain electrode. The floating grate region of the semiconductor photosensitization device is used for storing charges, and the floating grate potential of the semiconductor photosensitization device is related to light exposure intensity and time, thus, the invention can be used as a semiconductor photosensitization device. The invention also discloses production methods of the semiconductor photosensitization device and an image sensor, as well as an image sensor formed by arrays formed by the semiconductor photosensitization device. The semiconductor photosensitization device can simplify the design of a single pixel unit in a traditional image sensor and reduce the area occupied by the single pixel unit, thereby improving the pixel density of the image sensor, increasing the resolution of the image sensor and reducing the production cost of the image sensor.

A silicon-on-insulator (SOI) gated diode and non-gated junction diode are provided. The SOI gated diode has a PN junction at the middle region under the gate, which has more junction area than a normal diode. The SOI non-gated junction diode has a PN junction at the middle region thereof, and also has more junction area than a normal diode. The SOI diodes of the present invention improve the protection level offered for electrical overstress (EOS) / electrostatic discharge (ESD) due to the low power density and heating for providing more junction area than normal ones. The I / O ESD protection circuits, which comprise primary diodes, a first plurality of diodes, and a second plurality of diodes, all of which are formed of the present SOI diodes, could effectively discharge the current when there is an ESD event. And the ESD protection circuits, which comprise more primary diodes, could effectively reduce the parasitic input capacitance, so that they can be used in the RF circuits or HF circuits. The proposed gated diode and non-gated diode can be fully process-compatiable to general partially-depleted or fully-depleted silicon-on-insulator CMOS processes.

Junction diodes fabricated in standard CMOS logic processes can be used as program selectors for One-Time Programmable (OTP) devices, such as electrical fuses. At least one portion of the electrical fuse can have at least one extended area to accelerate programming. An extended area is an extension of the fuse element beyond contact or via longer than required by design rules. The extended area also has reduced or substantially no current flowing through. The program selector can be at least one MOS. The OTP device can have the at least one OTP element coupled to at least one diode in a memory cell.