33 results about "Electron spectrometer" patented technology

There is provided an element mapping unit, scanning transmission electron microscope, and element mapping method that enable to acquire an element mapping image very easily. On the scanning transmission electron microscope, the electron beam transmitted through an object to be analyzed enters into the element mapping unit. The electron beam is analyzed of its energy into spectrum by an electron spectrometer and an electron energy loss spectrum is acquired. Because the acceleration voltage data for each element and window data for 2-window method, 3-window method or contrast tuning method are already stored in a database and accordingly the spectrum measurement is carried out immediately even when an element to be analyzed is changed to another, the operator can confirm a two-dimensional element distribution map immediately. Besides, because every electron beam that enters into an energy filter passes through the object point, aberration strain in the electron spectrometer can be minimized and higher energy stability can be achieved. As a result, drift of the electron energy loss spectrum acquired by analyzing the electron beam into spectrum can be minimized and element distribution with higher accuracy can be acquired.

A charged particle spectrometer of hemispherical analyzer type for analyzing a particle emitting sample, the spectrometer comprising at least a first mechanism configured to move at least a part of the lens with respect to the axis between the sample spot and the analyzer entrance in a coordinate direction synchronously with a deflection of the particle beam.

A lens adjustment method and a lens adjustment system which adjust a plurality of multi-pole lenses of an electron spectrometer attached to a transmission electron microscope, optimum conditions of the multi-pole lenses are determined through simulation based on a parameter design method using exciting currents of the multi-pole lenses as parameters.

The invention discloses a nanometer Ag3PO4-modified and TiO2 heterojunction photo-catalytic membrane material and a preparing method thereof and belongs to the technical field of nanometer material preparation. Representation is carried out on the prepared material by adopting testing means, such as an X-ray diffractometer, an X-ray photo-electron spectrometer, an ultraviolet spectrograph and a scanning electronic microscope. The process of the method comprises the following steps: first, in an electrolytic solution containing silver ions and phosphate ions, utilizing a micro-arc oxidation technology to prepare a TiO2 membrane containing Ag and P on a Ti plate substrate; then, sintering Ag and P precursors in the membrane through muffle furnace sintering to form Ag3PO4 nanometer particles;and finally forming the nanometer Ag3PO4 / TiO2 heterojunction photo-catalytic membrane. The method has the advantages that the preparing process is simple and easy to control, the operation is convenient, the cost is low, the photocatalytic activity of the membrane is high, and the photocatalytic activity can be regenerated through forging.

An electron imaging apparatus 100 is disclosed, which is configured for an electron transfer along an electron-optical axis OA of an electron 2 emitting sample 1 to an energy analyzer apparatus 200, and comprises a sample-side first lens group 10, an analyzer-side second lens group 30 and a deflector device 20, configured to deflect the electrons 2 in an exit plane of the electron imaging apparatus 100 in a deflection direction perpendicular to the electron-optical axis OA. An electron spectrometer apparatus, an electron transfer method and an electron spectrometry method are also described.

In a spectral image formed by two orthogonal axes, one of which is an axis of the amount of energy loss and the other of which is an axis of positional information, by the use of an electron spectrometer and a transmission electron microscope, distortion in the spectral image of a sample to be analyzed is corrected with high efficiency and high accuracy by comparing electron beam positions calculated from a two-dimensional electron beam position image formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information) with reference electron beam positions, and calculating amounts of the distortion based on the differences of the electron beam positions. Method and apparatus are offered which correct distortion in a spectral image with high efficiency and high accuracy, the image being formed by the two orthogonal axes (the axis of the amount of energy loss and the axis of positional information).

A mesh (M) having an ellipsoid shape or a shape close to the ellipsoid shape is attached to an electrode (EL1) among electrodes (EL1 to ELn). Voltages of the later-stage electrodes (EL2 to ELn) are appropriately set. With this arrangement, a local negative spherical aberration generated by the mesh (M) is cancelled out with a positive spherical aberration. This optimizes an electric field distribution. As a result, this realizes an electrostatic lens whose acceptance angle is extended to about ±60°.

The invention discloses a positron-electron magnetic spectrometer with the angular resolution capability. The positron-electron magnetic spectrometer comprises an alignment hole array, a cylindrical magnet device and a positron-electron recording medium, wherein the alignment hole array is used for leading positrons and electrons into the cylindrical magnet device; the cylindrical magnet device comprises an outer shell, an inner shell and permanent magnets, the permanent magnets are fixed between the outer shell and the inner shell and are radially distributed; a magnetic field loop in which the movement directions of the positrons and the electrons are deflected is formed by space enclosed by all of the permanent magnets; the positron-electron recording medium is used for recording the intensity distribution of the positrons and the electrons on an imaging plane, so as to obtain the angular distribution of the positrons and the electrons and the information of an energy spectrum of the angular distribution. The positron-electron magnetic spectrometer has the advantages of reasonable structure and skillful design, the technical defects of low measurement precision and long time for adjusting a measurement range of an existing magnetic spectrometer are preferably overcome, and the diagnosis precision of an energy spectrum of the angular distribution of the positrons and the electrons is greatly increased, and therefore, the positron-electron magnetic spectrometer is suitable for popularization and application.

The invention discloses a nanometer Ag3PO4-modified and TiO2 heterojunction photo-catalytic membrane material and a preparing method thereof and belongs to the technical field of nanometer material preparation. Representation is carried out on the prepared material by adopting testing means, such as an X-ray diffractometer, an X-ray photo-electron spectrometer, an ultraviolet spectrograph and a scanning electronic microscope. The process of the method comprises the following steps: first, in an electrolytic solution containing silver ions and phosphate ions, utilizing a micro-arc oxidation technology to prepare a TiO2 membrane containing Ag and P on a Ti plate substrate; then, sintering Ag and P precursors in the membrane through muffle furnace sintering to form Ag3PO4 nanometer particles;and finally forming the nanometer Ag3PO4 / TiO2 heterojunction photo-catalytic membrane. The method has the advantages that the preparing process is simple and easy to control, the operation is convenient, the cost is low, the photocatalytic activity of the membrane is high, and the photocatalytic activity can be regenerated through forging.

The invention discloses an excited Brillouin scattering gain spectrum measuring method which comprises the steps of (1) conducting beam splitting on a beam of continuous laser generated by a laser device to obtain two beams of lasers, using one beam of laser as pumping light to be injected into a medium to be measured, enabling the excited Brillouin scattering effect to be generated in the medium to be measured, generating Stokes light which is opposite to the injected pumping light in transmission direction, using the other beam of laser as a light carrier to be modulated through an electrooptical modulator with loaded periodic electrical signals, and obtaining reference light, and (2) simultaneously inputting the reference light and the stokes light in a photoelectric detector, obtaining the light current through heterodyne detection, and using an electron spectrometer to process the light current to obtain an excited Brillouin scattering gain spectrum. By means of the excited Brillouin scattering gain spectrum measuring method, the bandwidth requirements of using equipment such as the modulator, the detector and the electron spectrometer can be reduced, and measurement on characteristics such as line types and the bandwidth of the excited Brillouin scattering gain spectrum is easily and stably achieved.

An electron imaging apparatus 100 is disclosed, which is configured for an electron transfer along an electron-optical axis OA of an electron 2 emitting sample 1 to an energy analyzer apparatus 200, and comprises a sample-side first lens group 10, an analyzer-side second lens group 30 and a deflector device 20, configured to deflect the electrons 2 in an exit plane of the electron imaging apparatus 100 in a deflection direction perpendicular to the electron-optical axis OA. An electron spectrometer apparatus, an electron transfer method and an electron spectrometry method are also described.

The present invention provides a real-time electron spectrometer based on a thin film scintillator and an optical fiber array. The spectrometer comprises an electron collimating device, a uniform magnetic field device, the thin film scintillator, the optical fiber line-to-plane conversion array and an imaging system; the electron collimating device, the uniform magnetic field device and the thin film scintillator are arranged in a housing; a coaxial hole in the axial direction of the electronic collimating device is formed in the housing; and the coaxial hole is used for assisting the position adjustment of the electron spectrometer. On the basis of a magnetic field deflection-based traditional electron spectrometer, the real-time electron spectrometer integrates advantages such as the real-time detection of the scintillator, low noise and flexibility of plastic optical fibers, high matching degree between the plane fiber array and the image plane of a detector. The electron spectrometer of the present invention is of simplicity and is easy to operate. The real-time electron spectrometer of the invention can diagnose and detect electrons of which the energy ranges from 0.98MeV to 4.55MeV, can be extended to higher energy bands and has a high application value in laser plasma physics.