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Impulse-resolving photo-electron spectrometer and method for impulse-resolving photo-electron spectroscopy

A technology of optoelectronics and energy spectrometer, applied in the field of physics

Pending Publication Date: 2020-09-29
德累斯顿莱布尼茨固体材料研究所
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Again, these measurements often require comprehensive and expensive equipment

Method used

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Examples

Experimental program
Comparison scheme
Effect test

example 1

[0104] can be vacuumed up to 10 -10 In the hPa vacuum chamber, starting from the electron emission sample, the electron emission sample and the focusing system are arranged successively along the optical axis.

[0105] Electron emission samples made of TaSe 2 composition and have the following dimensions: surface diameter 1mm and height 0.2mm.

[0106] The focusing system consists of electronic lenses and detectors.

[0107] The electron lens consists of a cylindrical container with a length of 108 mm and a diameter of 140 mm and a cylindrical inlet with a diameter of 30 mm and a length of 15 mm.

[0108] Two cylinders were successively arranged in the container at intervals of 5 mm along the optical axis direction, each having a radius of 49 mm, and the length of the first cylinder was 35 mm, and the length of the second cylinder was 42 mm. The cylindrical element adjacent to the inlet of the vessel was spaced 11 mm from the inner edge of the cylindrical inlet.

[0109] T...

example 2

[0120] To map the momentum distribution of electrons with energies below the Fermi energy (e.g. 16.98eV), all negative voltages are scaled down (V G = 0V, V 1 = -16.78V, V 2 = -16.63V, V D = -16.98V).

[0121] In this case, all electrons with energies of 16.98 eV and above up to the Fermi energy reach the detector. To determine the momentum distribution at 16.98 eV, the momentum distribution at the Fermi energy of the electrons of the same sample is subtracted to obtain the desired momentum distribution for an electron with a kinetic energy of 16.8 eV.

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PUM

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Abstract

The invention relates to the field of physics and relates to an impulse-resolving photo-electron spectrometer, by means of which the physical properties can be determined. The aim of the invention isto provide an impulse-resolving photo-electron spectrometer enabling the device components to have a simple structure with a significantly reduced overall volume. The aim of the invention is achievedby means of an impulse-resolving photo-electron spectrometer comprising components arranged one behind the other in the direction of the optical axis at least in a vacuum and which are each at least one electron emission sample and a focusing system, wherein the focusing system consists of at least one electron lens and at least one detector, wherein the electron lens consists of three cylindricalelements, wherein the first cylindrical element has a potential = 0 and the two subsequently arranged cylindrical elements have a potential of being not equal to 0, and wherein the detector is one ormore spatially resolved detectors which are arranged in the focal plane of the electron lens.

Description

technical field [0001] The invention relates to the field of physics and relates to a momentum resolution photoelectron energy spectrometer. With the momentum-resolved photoelectron spectroscopy and a method for momentum-resolved photoelectron spectroscopy, the physical properties of materials can be determined from their energy distribution and electronic structure. Background technique [0002] The physical properties of a material (such as electrical resistance, optical absorptivity, plasticity, etc.) are determined by the structure of the material's electrons. Thus, advantageously, a comprehensive and detailed knowledge of the electronic structure of a material needs to be obtained. In addition, this knowledge helps to predict new compounds and / or physical properties. Likewise, this knowledge can be used to construct electronic components, such as transistors or solar cells, with due regard to their properties. [0003] In order to determine the structure of the elect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/48H01J49/00H01J49/06
CPCH01J49/0004H01J49/06H01J49/48H01J49/46
Inventor S·博里森科
Owner 德累斯顿莱布尼茨固体材料研究所
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