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668 results about "Dual beam" patented technology

Electronically agile dual beam antenna system

The present invention provides an improved antenna system that, in one embodiment, includes an antenna array comprised of a plurality of elements, each of which is capable of providing a signal. Also included in the improved antenna system is a multi-beam beamformer for producing two spatially independent overlapping beams from the signals provided by two different subsets of the antenna array. The phase of the two beams is compared to realize an interferometer that can provide high or fine resolution data on the position of an object relative to the antenna system. The amplitude of the two beams can also be compared to obtain coarse data on the position of the object. The beamformer includes a switching network for selecting which elements of the antenna array form the two subsets. This permits, for example, the position of the beams to moved, the baseline of the two beams to be varied, and/or the beam width of the beams to be altered. To reduce adverse aerodynamic effects in certain applications, the antenna array is located conformal to the exterior surface of the body on which the array is mounted. Further, to reduce temperature related problems associated with high speed movement of the body on which the array is located, the array is located on the side of the body, as opposed to the front of the body. The side location also provides space for other types of sensors that are preferably located adjacent to the front surface of the body.
Owner:BALL AEROSPACE & TECHNOLOGIES

In-situ STEM sample preparation

A method for STEM sample preparation and analysis that can be used in a FIB-STEM system without a flip stage. The method allows a dual beam FIB / STEM system with a typical tilt stage having a maximum tilt of approximately 60 to be used to extract a STEM sample to from a substrate, mount the sample onto a TEM sample holder, thin the sample using FIB milling, and rotate the sample so that the sample face is perpendicular to a vertical electron column for STEM imaging.
Owner:FEI COMPANY

High Throughput TEM Preparation Processes and Hardware for Backside Thinning of Cross-Sectional View Lamella

A method for TEM sample preparation and analysis that can be used in a FIB-SEM system without re-welds, unloads, user handling of the lamella, or a motorized flip stage. The method allows a dual beam FIB-SEM system with a typical tilt stage to be used to extract a sample to from a substrate, mount the sample onto a TEM sample holder capable of tilting, thin the sample using FIB milling, and rotate the sample so that the sample face is perpendicular to an electron column for STEM imaging.
Owner:FEI COMPANY

Multi-stage interferometer circuit with waveform shaping function

A multi-stage interferometer circuit of the present invention includes: a multiplexing port; (N-1) stages of lattice type two-beam interferometers, wherein each stage includes a two-beam delay circuit having a path length difference of an integral multiple of M·Δ L / 2, and wherein the two-beam delay circuit of the lattice type two-beam interferometer of the first stage is connected to the multiplexing port; an M-beam interferometer including: two sets of 1×(M / 2) optical couplers connected to the first optical coupler of the lattice type two-beam interferometer at the final stage; an M-array delay circuit, each delay circuit of which has a delay length different from each other by ΔL; and M×M optical couplers; and M demultiplexing ports, wherein one or more transversal filters are arranged inside the multi-stage interferometer circuit so that the light guided between the demultiplexing port and the multiplexing ports passes therethrough at least once.
Owner:NIPPON TELEGRAPH & TELEPHONE CORP

Radar target intermediate frequency (IR) echo simulation system based on multi-beam amplitude-comparison angle measurement and control method thereof

The invention relates to a radar target intermediate frequency (IR) echo simulation system based on multi-beam amplitude-comparison angle measurement and a control method thereof, relating to the field of radar target echo simulation. The system comprises three target echo simulation boards and an arbitrary waveform generator instrument fixture, wherein the echo simulation boards are designed with a computer module PC104, a field programmable gate array (FPGA), direct digital synthesis (DDS) technique and a simulation circuit as cores; and the arbitrary waveform generator instrument fixture is designed with instrument programming control as the core. According to the invention, simultaneous 6-channel simulated target IR echo simulation of the radar of the multi-beam amplitude-comparison angle measurement system is realized, parameters of the simulated target echo such as distance, delay, echo amplitude, Doppler shift, pattern, direction pattern modulation, noise superposition and the like can be controlled, single-channel switching and output of dual-beam echo is realized, and the test use requirement of the radar signal processor of the system is met. In the invention, the arbitrary waveform generator instrument frock is utilized, thus improving the amplitude precision of the output echo signals; and the control program in the FPGA in the target echo simulation boards is designed by the soft IP core, thus providing convenience for hardware transplanting and clipping.
Owner:中国兵器工业第二0六研究所

Dual-beam materials-processing system

Apparatus and method for patterned sequential lateral solidification of a substrate surface, avoiding the need for demagnification to avoid mask damage from fluence sufficient to overcome the threshold for sequential lateral solidification, while using the high throughput of a common stage presenting both 1:1 mask and substrate simultaneously for patterning. The radiation source provides imaging beam and non-imaging beam, each of fluence below the threshold of sequential lateral solidification, but with aggregate fluence above the threshold. The imaging beam path includes a relatively delicate 1:1 mask and 1:1 projection subsystem, with optical elements including a final fold mirror proximate to the substrate surface, put the below-threshold mask pattern on the substrate surface. The non-imaging beam bypasses the delicate elements of imaging beam path, passing through or around the final fold mirror, to impinge on the substrate surface at the same location. Where the radiation patterns of the masked imaging beam and non-imaging beam coincide, their aggregate fluence exceeds the threshold for sequential lateral solidification. The dual selection provides pattern without damage to delicate optical elements.
Owner:ANVIK CORP

Dual-beam laser selective melting and moulding equipment with exchangeable powder cylinder

The invention discloses dual-beam laser selective melting and moulding equipment with an exchangeable powder cylinder. The equipment comprises two optical systems, a frame, a workbench plate, a powder feeding cylinder, a powder storage cylinder, a moulding cylinder, a powder returning cylinder, a moulding cavity, and two first driving mechanisms, which are used to respectively drive the moulding cylinder and powder feeding cylinder to move up and down. The workbench plate is fixed on the frame, the moulding cavity is fixed on the upper surface of the workbench plate, and the powder returning cylinder, the moulding cylinder, the powder feeding cylinder, and powder storage cylinder are fixed on the lower surface of the workbench plate from left to right in sequence. A scraper is arranged in the moulding cavity, and a second driving mechanism is arranged on the frame. A substrate is arranged in the powder feeding cylinder, a substrate is arranged in the moulding cylinder, the lower ends of the powder feeding cylinder and the moulding cylinder are both provided with a cylinder end cover, and the substrates are connected to a first piston system. A second piston system is arranged in the powder storage cylinder. The provided equipment has a high moulding efficiency and is capable of effectively reducing the deformation and cracking of members.
Owner:XI AN JIAOTONG UNIV
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