57 results about "Device degradation" patented technology

A technique is provided that allows the formation of contact etch stop layers having different intrinsic stress for different transistors, while substantially avoiding any device degradation owing to the partial removal of the contact etch stop layer. Hereby, an additional thin etch stop layer is provided prior to the formation of the contact etch stop layers, thereby substantially maintaining the integrity of metal silicide regions, when a portion of an initially deposited contact etch stop layer is removed.

The present invention is directed to a number of improvements in methods for reliability simulations in aged circuits whose operation has been degraded through hot-carrier or other effects. A plurality of different circuit stress times can be simulated within a single run. Different aging criteria may be used for different circuit blocks, circuit block types, devices, device models and device types. The user may specify the degradation of selected circuit blocks, circuit block types, devices, device models and device types independently of the simulation. Device degradation can be characterized in tables. Continuous degradation levels can be quantized. Techniques are also described for representing the aged device in the netlist as the fresh device augmented with a plurality of independent current sources connected between its terminals to mimic the effects of aging in the device. The use of device model cards with age parameters is also described. To further improve the circuit reliability simulation, a gradual or multi-step aging is used instead of the standard one step aging process. Many of these features can be embedded within the circuit simulator. A user data interface is also presented to implement these techniques and further allow users to enter their device models not presented in the simulator. For example, a proprietary model of, say, the substrate current in an NMOS could used be with a SPICE simulator employing a different model to simulate the aging of the circuit.

The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.

Apparatuses, systems, and methods are disclosed for implementing a cache policy. A method may include determining a risk of data loss on a cache device. The cache device may comprise a non-volatile storage device configured to perform cache functions for a backing store. The cache device may implement a cache policy. A method may include determining that a risk of data loss on the cache devices exceeds a threshold risk level. A method may include implementing a modified cache policy for the cache device in response to the risk of data loss exceeding the threshold risk level. The modified cache policy may reduce the risk of data loss below the threshold level.

An apparatus operable with a host and a data storage component for detecting a storage device susceptible to failure under I / O workload is provided. The apparatus includes a selector component for selecting a pair of storage devices in the data storage component. A data migration control component is provided for initiating migration of data from a first to a second storage device of the pair of storage devices. An I / O workload mirroring component is provided for mirroring an I / O workload from a first of the pair of storage devices to a second of the pair of storage devices. A storage device failure detecting component for detecting failure of one of the pair of storage devices is also included. The selector component further comprises a timer component for periodically initiating the selecting.

An ECU executes a program including the steps of: prohibiting startup of an engine when there is a request for execution of a deterioration diagnosis process and when the deterioration diagnosis process is in execution; and releasing prohibition of startup of the engine when the deterioration diagnosis process is completed.

A method is provided for monitoring an emission device coupled to an engine. In one example approach, the method comprises: following a deceleration fuel shut-off duration, indicating degradation of the emission device based on an amount of rich products required to cause a sensor to become richer than a threshold. The amount of rich products required may be correlated to an amount of oxygen stored in the emission device. The indication of emission device degradation may be further based on air mass and temperature during delivery of the required rich products.

A knowledge-based driver is provided for powering a solid-state light source with a constant current, including a memory that stores lumens per amp and volts per amp performance characterizations of the light source over time, and a controller that operates in a test mode to estimate the light source degradation based on voltage feedback obtained at a predetermined test current value, and to adjust the drive current in normal operating mode according to the estimated device degradation to implement constant lumens control without external optical feedback components.