The present invention relates to a ferroelectric analyzing device and a method for adjusting ferroelectric domain switching speed with the ferroelectric analyzing device, and pertains to the technical field of characteristic test of
solid-state dielectrics. The ferroelectric analyzing device comprises a
voltage pulse generator for generating square pulse
signal, which is biased on a ferroelectric thin film so as to switch the polarization of ferroelectric domains, the ferroelectric analyzing device further comprises a variable
resistor which is connected in series with the ferroelectric thin film. The variable
resistor is used for adjusting domain switching current so as to realize adjustment of domain switching speed of ferroelectric domains. In the method, the square pulse
signal is biased on the ferroelectric thin film, and an adjustment of domain switching speed of ferroelectric domains can be realized by adjusting the resistance value of the variable
resistor. The device can adjust the
moving speed of ferroelectric domains continuously, and can also adjust the coercive
voltage of the ferroelectric thin film; it does not depend on the
voltage pulse
signal generator, can be easily adjusted continuously, has a wide range of adjustment, and is reliable in data tests.