The invention discloses a
terahertz detector parameter measuring device and measuring method which are used for measuring parameters of various terahertz detectors such as response degree. According to the
terahertz detector parameter measuring device and measuring method, a method of intercomparison measurement between a standard
terahertz detector with an absolute response degree and a terahertz
detector to be tested is adopted. The method comprises the steps that
terahertz radiation of a reference
terahertz radiation source and
background radiation of a liquid-
nitrogen refrigerating
black body are modulated to be periodical changed
terahertz radiation signals by a light chopping slice, the periodical changed terahertz
radiation signals are alternately sent to an optical
system in a period and sent to the standard terahertz
detector or the terahertz
detector to be tested finally, and the periodical changed terahertz
radiation signals are converted to periodical changed
voltage signals and processed by a phase-lock
amplifier to obtain measuring
voltage signals; parameters of the response degree,
noise equivalent power and the like of the terahertz detector to be tested are calculated and obtained according to the absolute response degree value of the standard terahertz detector. The terahertz detector parameter measuring device is arranged in a liquid-
nitrogen refrigerating low-temperature vacuum background channel, the influence of
background noise on the accurate measurement of the terahertz detector is greatly reduced.