The invention discloses a method for preparing
strained silicon by
high energy X ray, and relates to the manufacturing field of an
integrated circuit. The method comprises the following steps of (1) synthesizing a Si / SiO<2> dual-layer composite
structural system, wherein the upper surface of the structure is covered with a
silicon thin film of a
silicon dioxide layer; (2) if partial strain needs to occur, placing a shielding layer above the Si / SiO<2> dual-layer composite
structural system, and forming a groove hole with the corresponding dimension and shape in the shielding layer above the required strain region of the
silicon thin film; and if global strain needs to occur, not placing the shielding layer; and (3) performing illumination on the Si / SiO<2> dual-layer composite
structural system by
high energy X ray through the shielding layer to prepare
strained silicon. By virtue of the initial application of the method of the
high energy X ray, by combination of the method of region-selecting shielding, and by virtue of the characteristic that the
X ray beam spot area is larger than the dimension of a silicon
wafer, quick preparation of
strained silicon is realized; and the methodhas the advantages of low
working temperature, controllable strain region, no introduction of
impurity, simple process, large scope of variables, high production efficiency, no silicon damage and thelike, and is expected to be widely applied to the fields of a
semiconductor integrated circuit, a micro-nano electronic device and the like.