The present invention discloses a testing system, especially a labview-based semiconductor laser chip testing system. The system comprises a computer, a spectrometer, a four-axis motor controller, a four-axis motor, an analog voltage output module, a voltage-to-current module, a multi-channel analog signal data collection module, a temperature control feedback circuits, an X / Y / Z three-dimensional motion platform, a T-axis one-dimensional translation stage, a vacuumizing chip bar adsorption stage, a laser power detector, a three-dimensional optical fiber coupling adjustment stage, a CCD camera monitoring system, a three-dimensional chip probe fixing adjustment frame, and a universal serial bus (USB). According to the testing system, the time for testing each single chip is as short as possible, and the production efficiency is greatly improved. In this way, the system is adapted to meet the requirement of the modern batch production. Meanwhile, the system can be applied to different types of surface-launching semiconductor lasers and meet the requirements of different performance tests. The repeated development work is reduced. The system is high in testing precision and good in repeatability, and the influence of manual factors is reduced as much as possible. At the same time, concerned procedure parameters can also be tested, thereby improving the coverage rate.