37results about How to "Improve S/N" patented technology

A light source unit (41) connected with a control unit (42) and an endoscope (101) emits whit light with a specified light quantity based on a signal from the control unit (42). The light source unit (41) comprises a lamp (15) as a white light source, an infrared cutting filter (15a), a light quantity limiting filter (16) inserted / removed into / from a light path to limit a light quantity in a specified wavelength region of white light, a filter inserting / removing drive unit (17) for inserting / removing the light quantity limiting filter (16) into / from the light path, and a condenser lens (18) for emitting white light. For example, the light quantity limiting filter (16) limits, when transmittance in a blue band is 100%, transmittance in the other bands to 50%. Accordingly, an S / N in a visible light region in generating a discrete spectral image by a lighting light is improved.

A solid state image pickup device 110 is provided with: a plurality of pixel units 10 that are arranged two-dimensionally and include a photoelectric conversion unit (photodiode PD) that converts light into a charge and an amplification unit (amplifier Q13) that converts the charge into a voltage and outputs it; a plurality of noise signal removal units (noise cancellation units 40) that are provided one for each column and remove noises contained in the voltage outputted from the amplifier Q31 of the pixel unit 10 belonging to the column; and a plurality of column amplification units (column amplifiers 70) that amplify the voltage outputted from the amplifier Q13 of the pixel unit 10 and output the amplified voltage to the noise cancellation unit 40, and enables increase in sensitivity and reduction in noise with low power consumption.

The present invention is capable of obtaining highly stabilized transmission and absorption spectra with high S / N and drift suppressed over a long time even when the amount of light of a light source temporally changes in a single-beam spectrophotometer. A spectrophotometer comprises: a light source; a sample cell; a polychromator which generates the transmission spectrum of a sample in the sample cell by dispersing light transmitted through the sample out of light from the light source into a plurality of wavelength components; an image sensor which detects the transmission spectrum of the sample; a light source monitor light detector which detects light not transmitted through the sample out of the light from the light source; and a calculation unit which corrects the transmission spectrum of the sample using an output signal of the light source monitor light detector.

An optical ranging sensor includes a light emitting unit for projecting a light beam on an object to be measured, a light receiving unit on which a light spot of reflected light of the light beam from the object is formed, and a processing circuit unit for processing output signals from the light receiving unit and detecting a distance to the object. The light receiving unit includes an effective light receiving part having light receiving cells arranged in matrix form in a first direction in which a position of the light spot moves as the object moves along a direction of an optical axis of the light emitting unit, and in a second direction orthogonal to the first direction. A size of the effective light receiving part in the second direction is not smaller than a radius of the light spot but not larger than a diameter thereof.

The invention refers to a radiation imaging apparatus, and specifically an X-ray imaging apparatus has first and second gratings, an X-ray image detector, and a differential phase image production section. The first grating passes X-rays emitted from an X-ray source to produce a first periodic pattern (G1 image). The second grating is disposed in a rotated state while being kept in parallel with the first grating. The second grating partly shields the G1 image to produce a second periodic pattern image (G2 image) with moire fringes. The X-ray image detector detects the G2 image to produce image data. The differential phase image production section produces a differential phase image based on the image data. The X-ray image detector has a difference in sharpness between two orthogonal directions within its detection surface, and is disposed such that one of the directions with the high sharpness crosses the moire fringes.

The present invention provides a piezoelectric microphone chip and a piezoelectric microphone, the piezoelectric microphone chip having high sensitivity to a sound pressure detection signal and beingsuitable for mounting to a package. The piezoelectric microphone is provided with: one thin plate; a diaphragm support structure that is provided on one surface of the thin plate, and comprises an outer edge support part for supporting the outer edge of the thin plate and a separating support part for dividing the thin plate into a plurality of diaphragms in cooperation with the outer edge supportpart; one or more piezoelectric conversion parts each formed by stacking, on each of the diaphragms, a first electrode, a piezoelectric film and a second electrode in order from the side of each of the diaphragms; and a signal detection circuit for detecting outputs from the piezoelectric conversion parts provided on the plurality of diaphragms, wherein the relationship among the thickness t1 ofthe outer edge support part, the thickness t2 of the separating support part, and the thickness td of the thin plate 10 is 13.3*td < t2 < t1-20 [mu]m.

The main scale (10) has a convex grating (12), for example a chrome film, formed on a base element (11). The base member (11) and the chrome thin film constitute a reflective surface, which is set to provide a sufficient amount of received light on the light receiving surface. The convex grating (12) can be precisely shaped by photoetching the film.

A display is provided. The display includes at least one display cell having a display circuit; at least one light receiving cell including a light receiving element; a light emitting section operative to radiate light to the side of a display surface; and a polarizing plate disposed on the front side in the display relative to a region in which the light emitting section is disposed and regions in which the display cell and the light receiving cell are formed, wherein a phase difference plate is disposed at a position which is on the front side relative to the light receiving cell and in either of an emitting optical path of the light emitting section and a reflecting optical path toward the light receiving cell.

A peak suppression method detects a peak value exceeding a threshold value of a transmitting signal, forms a peak value prediction signal which is limited to a noise cancelling frequency band of a receiving end, based on the detected peak value of the transmitting signal, and subtracts the peak value prediction signal from the transmitting signal.

A deep machining scratch is detected, if any, the position and size can be inferred, and thereby the examination time can be shortened. A surface examination device (9 )for examining the inner surface (3A) of a bore (3) formed in a cylinder block (5) by boring and honed on the basis of a digital brightness image (70) of the inner surface (3A) is provided with an evaluation image creating unit (55) for creating linear power spectrum images (71) in a direction perpendicular to the direction of the cutting scratch (P) along the direction of the cutting scratch (P) from the digital brightness image (70), arranging the linear power spectrum images (71) parallel, and thus creating an evaluation image (73) and evaluating unit (57) for evaluating the presence / absence of an unhoned region (Q) of the inner surface (3A) of the bore (3); on the basis of the pixel values of the pixels of the evaluating image (73).

Specularly reflected light from a convergence position on an object surface 31 enters a second critical-angle prism 14, another prism 15, and a first critical-angle prism 13 of a parallel beam selection optical system 20 in this order as a parallel beam traveling along the optical axis. The critical-angle prisms 13, 14 have critical angles of 45 degrees with respect to the wavelength of the light beam. Light beams other than the parallel light beam are removed at oblique surfaces 13a, 14a of the critical-angle prisms 13, 14, thereby allowing only the parallel light beam to exit as a regular light beam. This parallel beam is formed into a convergent light by a collimator lens 12, reflected by a half prism 11 and converged on an image pickup surface of an image pickup device 52. In this way, unnecessary noise light can be removed without placing a pin hole plate such as that placed before the image pickup plane in a confocal microscope.

The invention discloses a protein fragment. Nucleic acid sequences encoding the protein fragment is shown in SEQ ID No: 56 or SEQ ID No: 57 or SEQ ID No: 58. The invention further discloses a segmented green fluorescent protein system for protein interaction detection, which comprises GFP10 in a three-part sfGFP system, and further comprises a protein encoded by the nucleic acid sequence shown in SEQ ID No: 58, or further comprises proteins encoded by the nucleic acid sequences shown in SEQ ID No: 56 and SEQ ID No: 57. The invention further discloses recombinant vectors, recombinant bacteria, transgenic cell lines or expression cassettes comprising the aforementioned nucleic acid sequences, and also discloses the application of the protein fragment to detection of the interaction among proteins, or the application of the nucleic acid sequences to detection of the interaction among proteins. A fluorescent signal of the improved segmented sfGFP system is significantly improved.

A crystal oscillator piece in which generation of leakage oscillation is suppressed, and its manufacturing method. The method for manufacturing a crystal oscillator piece comprises a step for forming a first etching mask on the surface of a crystal wafer and forming a second etching mask on the backside thereof, dipping the crystal wafer in etching solution, and dissolving the crystal at a part not covered with the first etching mask and the second etching mask to form an oscillation leg, and characterized in that the length of a first projection projecting from a position corresponding to the first end of the first etching mask is set, in the second etching mask, such that the first residue formed on the first side face side becomes constant regardless of positional shift of the first and second etching masks, and the first and second etching masks regulate the second residue formed on the second side face side such that one of two main axes passing the centroid and intersecting a cross-section orthogonal to the longitudinal direction of the oscillation leg dynamically and perpendicularly is formed substantially in parallel with the surface or the backside of the crystal wafer.

The invention provides a thermal conductivity detector and a gas chromatograph. Detection sensitivity of a single-filament thermal conductivity detector is to be increased. A thermal conductivity detector is a single-filament thermal conductivity detector, and includes a measurement cell, a phase switching mechanism, and a measurement section. The measurement section starts measurement of thermalconductivity of a sample gas after a lapse of a sample gas measurement start time that is set in advance, after a reference phase is switched to a sample phase by the phase switching mechanism, and starts measurement of thermal conductivity of a reference gas after a lapse of a reference gas measurement start time that is set in advance as a length of time different from the sample gas measurementstart time, after the sample phase is switched to the reference phase by the phase switching mechanism.

A signal processing device is provided. The device includes an echo signal input unit for receiving echo signals resulted from transmission signals reflected on an object. The transmission signals are transmitted from a transmission source at transmission timings at predetermined time intervals, at least one of the transmission timings shifted from the other timings in time. The device includes a complex reception signal generator for generating complex reception signals, a phase calculator for calculating a phase change amount of the complex reception signals with respect to a reference phase, a phase corrector for phase-correcting the complex reception signals and outputting the corrected signals, and a Doppler processor for performing Doppler processing on the corrected signals and outputting the Doppler-processed signals as Doppler echo signals of the object.

The invention relates to an apparatus for radiometrically investigating a plurality of samples, with: a radiation device providing a plurality of radiation elements, a radiation element comprising at least one emitter element, wherein the radiation device preferably provides at least two emitter elements which provide radiation with different radiation spectra, wherein at least two of said emitter elements are adapted to emit radiation during time periods which at least partially overlap, and a control device, controlling said radiation elements, a sample holder member providing a plurality of sample positions for supporting a plurality of samples, wherein preferably at least a part of the radiation device and the sample holder member are adapted to be moved against each other during the investigation procedure and wherein at least one radiation element is adapted to irradiate a sample with radiation via a first optical path which causes the sample to emit sample radiation with at least one sample radiation frequency via a second optical path towards at least one detection device, said at least one detection device being adapted to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap; and an evaluation device which is adapted to evaluate the sample radiation of at least one individual sample from said sum signal. The invention relates further to a method for photometrically investigating sample radiations of at least one sample, which are caused by the radiation of N emitter elements of at least one radiation element wherein said N emitter elements are emitting radiation during time periods which at least partially overlap, to detect the sample radiation of at least two samples as a sum signal during time periods which at least partially overlap and to evaluate the sample radiation of at least one individual sample from said sum signal.

A light source unit (41) connected with a control unit (42) and an endoscope (101) emits whit light with a specified light quantity based on a signal from the control unit (42). The light source unit (41) comprises a lamp (15) as a white light source, an infrared cutting filter (15a), a light quantity limiting filter (16) inserted / removed into / from a light path to limit a light quantity in a specified wavelength region of white light, a filter inserting / removing drive unit (17) for inserting / removing the light quantity limiting filter (16) into / from the light path, and a condenser lens (18) for emitting white light. For example, the light quantity limiting filter (16) limits, when transmittance in a blue band is 100%, transmittance in the other bands to 50%. Accordingly, an S / N in a visible light region in generating a discrete spectral image by a lighting light is improved.

A solid state image pickup device 110 is provided with: a plurality of pixel units 10 that are arranged two-dimensionally and include a photoelectric conversion unit (photodiode PD) that converts light into a charge and an amplification unit (amplifier Q13) that converts the charge into a voltage and outputs it; a plurality of noise signal removal units (noise cancellation units 40) that are provided one for each column and remove noises contained in the voltage outputted from the amplifier Q31 of the pixel unit 10 belonging to the column; and a plurality of column amplification units (columnamplifiers 70) that amplify the voltage outputted from the amplifier Q13 of the pixel unit 10 and output the amplified voltage to the noise cancellation unit 40, and enables increase in sensitivity and reduction in noise with low power consumption.

Each element is configured such that the linear ion optical axis (C1) of the ion source (11), the first ion lens (12), and the front-stage quadrupole mass filter (13) are in contact with the ions in the collision unit (14) The linear ion beam axis (C2) of the guide (15) and the rear-stage quadrupole mass filter (18) obliquely intersects at a predetermined angle in the space between the front-stage quadrupole mass filter and the collision cell. The metastable He molecules (He*) generated by the ion source cannot reach the exit of the collision cell and are removed even if they pass through the front-stage quadrupole mass filter. On the other hand, the precursor ions passing through the front-stage quadrupole mass filter are bent along the zigzag ion optical axis under the action of the DC electric field formed by the ion lens (16) on the entrance side, and are efficiently introduced into the collision cell . He*, which causes noise, can be reliably removed without using an ion optical element with a special shape or structure.

Disclosed herewith is an information reproducing method for realizing significant expansion of disk capacity and processing signals having different minimum run lengths, as well as an optical disk drive that uses the method. To achieve the above objects, a PRML method is used. According to the method, a compensation value is added to an initial target value decided by a convolution operation of NN bits according to a bit array consisting of N bits (N>NN) to obtain a new target value, which is then compared with each of reproduced signals sequentially to select a bit array in which the error between the reproduced signal and the target signal is minimized most likely, then the selected bit array is binarized.

An orientation analyzer, which can quickly measure the fiber orientation of paper, the molecular orientation of film, or the orientation of fillers in plastics, reducing the cost and volume of parts. The orientation analyzer of the present invention measures the object to be measured based on a light-emitting assembly that irradiates light to the object to be measured, a light-receiving assembly that receives reflected light reflected by the object to be measured, and a signal from the light-receiving assembly. Orientation of objects, wherein multiple light emitting components are arranged around the light receiving component.