Provided is a conversion card for testing a
probe card. The conversion card comprises a plate body, and a plurality of first transmission units, a plurality of second transmission units and a DC / AC conversion circuit; and the first transmission units, the second transmission units and the DC / AC conversion circuit are disposed on the plate body. The first transmission units are electrically connected with a test instrument. The second transmission units are electrically connected with interfaces of the
probe card. The DC / AC converting circuit is electrically connected with the first transmission units and the second transmission units. AC signals are transmitted by the first transmission units, and the AC signals are transmitted to the DC
probe card through the DC / AC conversion circuit, the second transmission units and the interfaces of the probe card. By using principles of an
AC circuit and a
transmission line, the conversion card cooperates with AC
signal test instruments of a
logic analyzer, an
oscilloscope, a time-domain reflectometer, a
frequency domain network analyzer, an error code generator, an
eye pattern analyzer and the like. An AC method is used to perform
error analysis and improvement on the DC probe card, thereby preventing the misjudging error rate of the probe card, reducing the card changing rate and the pin removing rate, and reducing the inventory ratio of the DC probe card.