476 results about "Two dimensional imaging" patented technology

A two-dimensional imaging surface plasmon resonance (SPR) apparatus for optical surface analysis of a sample area on a sensor surface is disclosed. The apparatus comprises a sensor surface layer of a conductive material that can support a surface plasmon, such as a free electron metal, e.g. gold, silver or aluminum, a source of electromagnetic beams of two or more wavelengths that illuminate a two-dimensional surface area from either the front or the backside of the sensor surface layer, and a detector for simultaneous, or pseudo simultaneous, detection of two or more wavelengths of reflected intensities from the two-dimensional surface area, providing two or more two-dimensional images of the surface area, the two-dimensional images being a function of the effective refractive index at each point on the surface area. The two-dimensional images put together result in a color image. The apparatus is suitable for use in biological, biochemical, chemical and physical testing.

A method of objectively quantifying assessments of joints having arthritis for purposes of assessment, diagnosis and treatment. The objective measurements utilize known imaging modalities including 3D scanning, thermal imaging, visible and near-infrared imaging and two-dimensional imaging to quantify swelling, heat distribution, erythema, and range or motion. The objective measurements can be combined in various ways to assess the extent of the disease and can be used to adjust treatment protocols.

A spectrally encoded endoscopic probe having high resolution and small diameter comprising at least one flexible optical fiber; an energy source; a grating through which said energy is transmitted such that the energy spectrum is dispersed; a lens for focusing the dispersed energy spectrum onto a sample such that the impingement spot for each wavelength is a separate position on the sample, the wavelength spectrum defining a wavelength encoded axis; means for mechanically scanning the sample with focused energy in a direction perpendicular to the wavelength encoded axis; a means for receiving energy reflected from the sample; and, a means for detecting the received reflected energy. The probe grating and lens delivers a beam of multi-spectral light having spectral components extending in one dimension across a target region and which is moved to scan in another direction. The reflected spectrum is measured to provide two dimensional imaging of the region.

For two-dimensional imaging of scenes through continuous passive or active microwave scanning, use is made of a fully mechanized directional antenna array comprising a main reflector (1), a primary radiator array (3) and a subreflector (2) having a small size in comparison to the main reflector and being tilted relative to the optical axis (7) of the directional antenna array. First drive means (8) are operative to rotate the subreflector (2) about the optical axis (7), and second drive means (17,18) are operative to move the total directional antenna array in a direction approximately vertical to the optical axis (7). The moving speed of the subreflector (2) is very high in comparison to that of the total directional antenna array. The shape of the main reflector (1), the shape of the subreflector (2), the primary radiator (3), the distance between primary radiator and subreflector and the distance between subreflector and main reflector as focusing parameters are attuned to each other in such a manner that, for a given scene distance, an optimum focusing and an optimum size of the field of view are achieved. The focusing parameters and the moving speeds of the two drive means are set in a manner allowing for a gapless, continuous scanning of the scene with the aid of the focusing spot (12) moving at the scene distance. Applicability in remote investigation, particularly in earth observation and in safety technology.

Methods and apparatus for non-contact thermal measurement which are capable of providing sub micron surface thermal characterization of samples, such as active semiconductor devices. The method obtains thermal image information by reflecting a light from a surface of a device in synchronous with the modulation of the thermal excitation and then acquiring and processing an AC-coupled thermoreflective image. The method may be utilized for making measurements using different positioning techniques, such as point measurements, surface scanning, two-dimensional imaging, and combinations thereof. A superresolution method is also described for increasing the resultant image resolution, based on multiple images with fractional pixel offsets, without the need to increase the resolution of the image detectors being utilized. The thermoreflective method provides a spatial resolution better than current infrared cameras, operates within a wide temperature range, and is capable of a thermal resolution on the order of 10 mK°.