The invention discloses a method for measuring
dielectric properties of
diamond anvil cells in situ and belongs to the technical field of electromagnetic measurement under
high voltage. The method comprises the following steps of firstly, assembling the
diamond anvil cells, i.e. respectively forming round electrodes on the anvil surfaces of two
diamond anvil cells, wherein an insulating layer is arranged on the inner side wall of a sample cavity of a composite insulating
cushion; secondly, performing measurement, i.e. using a
frequency response analysis meter to obtain relation patterns between an impedance real part and an impedance virtual part under different pressures; and finally, performing
data processing, i.e. using Zview
software and an electromagnetic metering formula related to
dielectric properties to obtain the relative
dielectric constant epsilon r, the dielectric constant real part epsilon', the dielectric constant virtual part epsilon'', the loss tan theta and the like. The shapes and the positions of the electrodes are fixed, and meanwhile, correction is performed because of the influence of fringe effect on a measuring result; and the prepared composite insulating
cushion ensures complete insulation of the inner wall of a
voltage cavity, so that the method for precisely measuring the dielectric properties of a material in situ under
high voltage is realized.