161 results about "Checkerboard pattern" patented technology

An imaging system has a single focal plane array that does not require the precise alignment of multiple cameras relative to one another. It incorporates a multi-band, band pass filter that includes filter elements corresponding to pixel regions of a detector within a camera. The imaging system may further incorporate a detector that vertically discriminates among radiation in different spectral bands incident on an image plane of the detector. In this manner, spectral content may be determined in each spatial region without the need for beam splitting or multiple cameras. The filter itself may further comprise different filter elements, for example, filter elements A and B arranged in a checkerboard pattern, where filter element A passes different spectral bands than filter element B. In this manner, multi-spectral, high resolution images may be generated using a single camera that significantly improves upon image discrimination as compared to, for example, the Bayer color filter array pattern. The single camera implementation is well suited for incorporation into marine, land and air vehicles.

A microlens array with reduced or no empty space between individual microlenses and a method for forming the same. The microlens array is formed by patterning a first set of microlens precursors in a checkerboard pattern on a substrate. The first set of microlens precursors is reflowed and cured into first microlenses impervious to subsequent reflows. Then, a second set of microlens precursors is patterned in spaces among the first microlenses, reflowed and cured into second microlenses. The reflows and cures can be conducted under different conditions, and the microlenses may be differently sized. The conditions of the reflows can be chosen to ensure that the focal lengths of microlenses are optimized for maximum sensor signal.

A multi-color IR imaging device includes optics that direct mid-wave infrared (MWIR) and long-wave infrared (LWIR) radiation onto a focal plane array having LWIR and MWIR detection layers. Pixel groups that include at least one first pixel and one second pixel are defined on the focal plane array, and a first filter and a second filter which form part of an inhomogeneous filter is placed over the respective first and second pixels in a checkerboard pattern, in close proximity to the detection layers. This allows MWIR radiation in M band, and LWIR radiation in an L1 band to pass therethrough and illuminate the first pixels, and M, L1, and a separate LWIR band designated L2 to pass therethrough and illuminate the second pixels. To simultaneously image both MWIR and LWIR, the focal plane array is placed at a predetermined distance from the optics so that the MWIR spot size covers a single pixel and the LWIR spot size is about the same area as the area of a group of two first pixels and two second pixels. Since all pixels receive the M band, half of the pixels in the group receive the L1 band, and the other half receives the L2 band, three bands can be generated. This allows simultaneous imaging of MWIR and two sub-bands of the LWIR from the same point in space.

It is an object of the present invention to provide a nitride semiconductor device with low parasitic resistance by lowering barrier height to reduce contact resistance at an interface of semiconductor and metal. The nitride semiconductor device includes a GaN layer, a device isolation layer, an ohmic electrode, an n-type Al0.25Ga0.75N layer, a sapphire substrate, and a buffer layer. A main surface of the n-type Al0.25Ga0.75N layer is on (0001) plane as a main surface, and concaves are arranged in a checkerboard pattern on the surface. The ohmic electrode contacts the sides of the concaves of the n-type Al0.25Ga0.75N layer, and the sides of the concaves are on non-polar surfaces such as (11-20) plane or (1-100) plane.

A multi-band focal plane array architecture operative to detect multiple spectral image. The multi-band focal plane array architecture has an integrated readout circuit, a plurality of first detectors integrated in the readout circuit and a plurality of second detectors deposited on the readout circuit. Preferably, the first detectors are operative to detect visible signals and the second detectors are operative to detect infrared signals. The first and second detectors are arranged in a checkerboard pattern, in alternate rows or columns, or at least partially overlapped with each other to realize simultaneous detection in two different wavelength bands. The architecture may also have an additional integrated readout circuit flip-chip bonded to the integrated readout circuit. By forming a plurality of third detectors on the additional integrated readout circuit, a tri-band focal plane array may be realized. In one embodiment, a dual-band focal plane array architecture by forming two arrays of detectors on two individual integrated readout circuit and flip-chip bonding these two readout circuits.

A microlens array with reduced or no empty space between individual microlenses and a method for forming the same. The microlens array is formed by patterning a first set of microlens precursors in a checkerboard pattern on a substrate. The first set of microlens precursors is reflowed and cured into first microlenses impervious to subsequent reflows. Then, a second set of microlens precursors is patterned in spaces among the first microlenses, reflowed and cured into second microlenses. The reflows and cures can be conducted under different conditions, and the microlenses may be differently sized. The conditions of the reflows can be chosen to ensure that the focal lengths of microlenses are optimized for maximum sensor signal.

A device for determining the angle of incidence (alpha) of incident radiation and particularly sunlight (S) includes an array of light sensitive elements (10, 11 and 12) and a shadow mask (15) arranged above the elements. The shadow mask (15) includes a transparent region (14) and a non-transparent region (13) with a linear boundary or edge (16) therebetween. The linear edge (16) is arranged above the center of the linear array (9) of light sensitive elements (10, 11 and 12) so as to extend at a right angle relative to the linear direction of the array. To determine the angle of incidence (alpha), a coarse determination of the number of completely shaded light sensitive elements (10), and a fine determination of the fractional shading portion of the partially shaded light sensitive element (11) immediately adjacent to the completely shaded elements, are carried out. In this manner, a very high precision and accuracy can be achieved, exceeding the physical resolution determined by the size of the individual light sensitive elements, while still maintaining a simple and reliable construction. The angles of incidence (alpha) and (beta) in two perpendicular planes can be determined by providing a two-dimensional array of light sensitive elements in connection with a shadow mask having a two-dimensional checkerboard pattern of transparent regions and non-transparent regions.

Methods, systems, and apparatuses for ways of testing tags are provided. In an aspect of the present invention, an antenna is mounted in a cavity of a surface. The antenna transmits a test signal, such as a radio frequency (RF) test signal, to the antenna of an adjacent tag, to test the adjacent tag. In aspects, multiple cavities having antennas may be arranged in various ways in the surface, such as in a “checkerboard pattern” (e.g., diagonally positioned from each other), to test multiple tags in a web of tags simultaneously. In another aspect, tags that are not being tested may be held at an electrical voltage, such as a ground voltage, to disable the tags from responding to the test signals of other tags. For example, in an aspect, a vacuum system may be used to hold tags in a web of tags to the surface to hold antennas of the tags at the electrical voltage.

An image sensor for capturing a color image, comprising a two-dimensional array of pixels having a plurality of minimal repeating units wherein each repeating unit is composed of eight pixels having four panchromatic pixels, two pixels having the same color response, and two pixels having different color responses that are different than the pixels having the same color response, with the minimal repeating units tiled to cause each row or each column of the image sensor to have color pixels of a single color or to cause each row and each column to have color pixels of only two colors.

An imaging device includes a sensor having a cell layout having a plurality of chromatic color pixels and high-sensitivity pixels having higher sensitivity to incident light than the chromatic color pixels arranged in a checkerboard pattern, a white balance block that normalizes the pixel output from the sensor with respect to the chromatic color pixels or the high-sensitivity pixels, a pixel interpolation block that performs interpolation on the phase where a chromatic color pixel is present by interpolating the other lacking colors, and a noise reduction block that is situated between the white balance block and the pixel interpolation block, and performs interpolation on phases of the chromatic color pixels based on the signal component of the high-sensitivity pixels so as to suppress noise in the chromatic color pixels.

The present invention relates to a high precision method, model and apparatus for calibrating, determining the rotation of the lens scope around its symmetry axis, updating the projection model accordingly, and correcting the image radial distortion in real-time using parallel processing for best image quality.The solution provided herein relies on a complete geometric calibration of optical devices, such as cameras commonly used in medicine and in industry in general, and subsequent rendering of perspective correct image in real-time. The calibration consists on the determination of the parameters of a suitable mapping function that assigns each pixel to the 3D direction of the corresponding incident light. The practical implementation of such solution is very straightforward, requiring the camera to capture only a single view of a readily available calibration target, that may be assembled inside a specially designed calibration apparatus, and a computer implemented processing pipeline that runs in real time using the parallel execution capabilities of the computational platform.

An integrated imaging element for an interferometer generates at least one image that includes multiple interference portions with different relative phase shifts interleaved in a pattern having a high spatial frequency in the image. The interleaved pattern is at least partially determined by the pattern of a high density polarizing array used in the integrated imaging element. In various embodiments, the multiple interference portions are interleaved in a checkerboard pattern across the entire surface of a detector device. As a result, various non-common mode errors present in various interferometers that generate separate non-interleaved images for each relative phase are reduced or eliminated because multiple phase-shifted interference image information for a small region of an object is provided within a small region on the detector device.