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1965results about "Accelerators" patented technology

Charged particle beam irradiation equipment and control method thereof

A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an irradiation object is moved, the first power supply unit, namely a power supply unit having no filter, is used to apply the voltage to the scanning electromagnet, so that an exciting current flowing in the scanning electromagnet can be changed in a short time. Further, when the irradiation position of the charged particle beam is maintained, the second power supply is used to apply a voltage whose pulsating component was removed to the scanning electromagnet, so that the exciting current flowing in the scanning electromagnet can be controlled precisely. Consequently, the charged particle beam can be applied uniformly to the irradiation object and an irradiation time of the charged particle beam to the irradiation object can be curtailed.
Owner:HITACHI LTD

Chip-scale atomic clock (CSAC) and method for making same

A clock including: a portable, at least partially evacuated housing; a cell being positioned within the housing and including an internal cavity having interior dimensions each less than about 1 millimeter, an intra-cavity pressure of at least about 760 Torr, and containing a metal atomic vapor; an electrical to optical energy converter being positioned within the housing to emit light through the metal atomic vapor; an optical energy intensity detector being positioned within the housing to receive the light emitted by the converter through the metal atomic vapor; at least one conductive winding around the cavity to stabilize the magnetic field experienced in the cavity dependently upon the detector; and, an output to provide a signal from the housing dependently upon the detector detecting the light emitted by the converter through the metal atomic vapor.
Owner:SARNOFF CORP

Charged particle beam irradiation equipment having scanning electromagnet power supplies

A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an irradiation object is moved, the first power supply unit, namely a power supply unit having no filter, is used to apply the voltage to the scanning electromagnet, so that an exciting current flowing in the scanning electromagnet can be changed in a short time. Further, when the irradiation position of the charged particle beam is maintained, the second power supply is used to apply a voltage whose pulsating component was removed to the scanning electromagnet, so that the exciting current flowing in the scanning electromagnet can be controlled precisely. Consequently, the charged particle beam can be applied uniformly to the irradiation object and an irradiation time of the charged particle beam to the irradiation object can be curtailed.
Owner:HITACHI LTD

High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers

Devices and methods are provided for generating laser-accelerated high energy polyenergetic positive ion beams that are spatially separated and modulated based on energy level. The spatially separated and modulated high energy polyenergetic positive ion beams are used for radiation therapy. In addition, methods are provided for treating patients in radiation treatment centers using therapeutically suitable high energy polyenergetic positive ion beams that are provided by spatially separating and modulating positive ion beams. The production of radioisotopes using spatially separated and modulated laser-accelerated high energy polyenergetic positive ion beams is also provided.
Owner:INST FOR CANCER RES
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