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117 results about "Capacitive accelerometer" patented technology

A capacitive accelerometer is a type of accelerometer device that measures the acceleration on a surface using capacitive sensing techniques. It has the ability to sense static and dynamic acceleration on equipment or devices - enforced by human or mechanical forces - and converts this acceleration into electrical currents or voltage.

Monolithic integrated CMOS (Complementary Metal Oxide Semiconductor) MEMS (Micro-electromechanical Systems) multilayer metal three-axis capacitive accelerometer and manufacturing method thereof

The invention provides a monolithic integrated three-axis accelerometer and a manufacturing method thereof so as to solve the defects in structure and manufacturing technology of the existing structural capacitive accelerometer. Three layers of metal Al thin films are deposited in the direction of an axis Z so as to form a comb pair sensitive electrode; four layers of metal Al/SiO2 thin films are deposited in the directions of an axis X and an axis Y so as to form comb pair sensitive electrodes, and the accelerations of the three axis directions are detected simultaneously by a single integrated structure. The accelerometer and the manufacturing method thereof have the following positive technical effects: the interconnection stray capacitance among accelerator devices in three axis directions is lowered remarkably, and high detection accuracy and lower noise performance are realized; since the accelerometer is provided with the multiple metal layers, compared with a microaccelerometer manufactured from the same material, namely polycrystalline silicon, the accelerometer is more flexible in wiring; a foldable beam is used in the structure of the accelerometer, so that the own stress of the accelerometer is released better, and therefore the influence of the stress on the system can be reduced effectively.
Owner:HEFEI UNIV OF TECH

Microelectromechanical three-axis capacitive accelerometer

A micromechanical structure for a MEMS three-axis capacitive accelerometer is provided with: a substrate; a single inertial mass having a main extension in a plane and arranged suspended above the substrate; and a frame element, elastically coupled to the inertial mass by coupling elastic elements and to anchorages, which are fixed with respect to the substrate by anchorage elastic elements. The coupling elastic elements and the anchorage elastic elements are configured so as to enable a first inertial movement of the inertial mass in response to a first external acceleration acting in a direction lying in the plane and also a second inertial movement of the inertial mass in response to a second external acceleration acting in a direction transverse to the plane.
Owner:STMICROELECTRONICS SRL

Pendulous accelerometer with balanced gas damping

InactiveUS20090107238A1Balanced gas dampingHigh sensitivityAcceleration measurementChip sizeEngineering
A pendulous capacitive accelerometer including a substrate having a substantially planar upper surface with an electrode section, and a sensing plate having a central anchor portion supported on the upper surface of the substrate to define a hinge axis. The sensing plate includes a solid proof mass on a first side of the central anchor portion and a substantially hollow proof mass on a second side of the central anchor portion, providing for reduced overall chip size and balanced gas damping. The solid proof mass has a first lower surface with a first electrode element thereon, and the substantially hollow proof mass has a second lower surface with a second electrode element thereon. Both the solid proof mass and the hollow proof mass have the same capacitive sensing area. The sensing plate rotates about the hinge axis relative to the upper surface of the substrate in response to an acceleration.
Owner:ROSEMOUNT AEROSPACE

Temperature compensating device for micro-machined capacitive accelerometer

The invention discloses a temperature compensating device for a micro-machined capacitive accelerometer. The temperature compensating device mainly comprises a coherent demodulator, a low pass filter and a temperature compensating circuit, wherein an output end of the coherent demodulator is connected with an input end of the low pass filter; and the output end of the low pass filter is connectedwith the input end of the low temperature compensating circuit. By taking the internal capacitance which changes with the temperature of the micro-machined capacitive accelerometer as a compensating reference signal of an output signal of the accelerometer, the temperature compensating device does not need a thermistor or an integrated temperature sensor for measuring the temperature of an acceleration sensor, so the structure of the temperature compensating device is simplified, and the cost is reduced; the influence on compensating precision due to temperature measurement error is eliminated, and the temperature compensating precision is improved; and no temperature sensor is needed to be arranged and used on the micro-machined capacitive accelerometer, so a temperature measurement error due to a temperature gradient of a metal pipe shell of the acceleration sensor is avoided, and the temperature compensating precision is further improved.
Owner:ZHEJIANG UNIV

Method for manufacturing monolithic polysilicon cantilever structure

The invention relates to a method for manufacturing a monolithic polysilicon cantilever structure. In the invention, a processing step of the polysilicon cantilever structure is inserted in a conventional BiCMOS (Bipolar Complementary Metal Oxide Semiconductor) technical process, the deposition and the annealing of polysilicon are finished and an MEMS (Micro-Electro-Mechanical Systems) high-temperature process is prevented from influencing on the metalation process before the metalation process. In the release process of the polysilicon cantilever structure, a special etching solution is adopted, and a negative photoresist is used as a post of the polysilicon cantilever structure so as to effectively avoid the problem of substrate adhesion in the cantilever structure release process by using a wet method. The method provided by the invention solves the technical problems of compatibility between a manufacture process of the polysilicon cantilever structure and a processing process of a BiCMOS circuit, realizes the monolithic integration of the polysilicon cantilever structure and a BiCMOS signal processing circuit, and can be widely applied to the monolithic integration manufacture field of MEMS sensors, such as capacitive accelerometers, gyroscopes, and the like.
Owner:NO 24 RES INST OF CETC

Test device and test method for thermal sensitivity drift of impact accelerometer

The invention relates to a test device for testing the change of the sensitivity output of an impact accelerometer with temperature. The test device comprises a temperature control box, a metal rod, apneumatic system, an accelerometer signal amplifier, a laser interferometric speed measuring device, and a computer for data sampling and data processing; the metal rod is horizontally supported by asupporting structure and can move freely axially; one end of the metal rod is aligned with the pneumatic system; the other end of the metal rod fixes an accelerometer to be tested and is arranged inthe temperature control box; the output signals of the accelerometer are inputted to the signal amplifier through a wire; the laser interferometric speed measuring device emits laser onto the metal rod and receives reflected laser; the output signals of the accelerometer signal amplifier and the laser speed measuring device are connected with the computer through data wires; and a relationship between the sensitivity output of the accelerometer to be tested and temperature is obtained by means of an absolute method. The test device of the invention has the advantages of large impact acceleration, directness and relatively high accuracy.
Owner:SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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