2101results about How to "Reduce signaling" patented technology

The present invention comprises one or more microprocessors programmed to execute methods for improving the performance of an analyte monitoring device including prediction of glucose levels in a subject by utilizing a predicted slower-time constant (1 / k2). In another aspect of the invention, pre-exponential terms (1 / c2) can be used to provide a correction for signal decay (e.g., a Gain Factor). In other aspects, the present invention relates to one or more microprocessors comprising programming to control execution of (i) methods for conditional screening of data points to reduce skipped measurements, (ii) methods for qualifying interpolated / extrapolated analyte measurement values, (iii) various integration methods to obtain maximum integrals of analyte-related signals, as well as analyte monitoring devices comprising such microprocessors. Further, the present invention relates to algorithms for improved optimization of parameters for use in prediction models that require optimization of adjustable parameters.

An imaging system is presented for imaging objects within a field of view of the system. The imaging system comprises an imaging lens arrangement, a light detector unit at a certain distance from the imaging lens arrangement, and a control unit connectable to the output of the detection unit. The imaging lens arrangement comprises an imaging lens and an optical element located in the vicinity of the lens aperture, said optical element introducing aperture coding by an array of regions differently affecting a phase of light incident thereon which are randomly distributed within the lens aperture, thereby generating an axially-dependent randomized phase distribution in the Optical Transfer Function (OTF) of the imaging system resulting in an extended depth of focus of the imaging system. The control unit is configured to decode the sampled output of the detection unit by using the random aperture coding to thereby extract 3D information of the objects in the field of view of the light detector unit.

The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process and an inspection method using the inspection system. The inspection system according to the present invention includes a plurality of inspection electrodes, a plurality of inspection antennas, a position control unit, a unit for applying voltage to each of the inspection antennas, and a unit for measuring potentials of the inspection electrodes. One feature of the inspection system is that a plurality of ID chips and the plurality of inspection electrodes are overlapped with a certain space therebetween, and the plurality of ID chips and the plurality of inspection antennas are overlapped with a certain space therebetween, and the plurality of ID chips are interposed between the plurality of inspection electrodes and the plurality of inspection antennas by the position control unit.