34results about How to "Quick and easy testing" patented technology

A testing method of a thin-film magnetic head has an MR read head element with a multi-layered structure including a magnetization-fixed layer, a magnetization-free layer and a nonmagnetic intermediate layer or a tunnel barrier layer sandwiched between the magnetization-fixed layer and the magnetization-free layer. The method includes a step of feeding through the MR read head element a sense current, a step of measuring non-signal output versus frequency characteristics of the MR read head element over a frequency range that covers at least FMR of the magnetization-fixed layer, and a step of discriminating whether the thin-film magnetic head is a head providing high-temperature noises by comparing a frequency of a peak of the non-signal output resulting from FMR of the magnetization-fixed layer with a threshold.

A testing device for testing a printed circuit board comprises a testing signal converting module which comprises a connector for receiving testing signals from the printed circuit board and a converting circuit for converting the testing signals to compatible signals, the converting circuit is coupled to the connector. A testing circuit receives compatible signals from the testing signal converting module.

A test lead assembly is provided for an electrical connector assembly, such as a terminal board. The terminal board includes a generally planar member and a number of fasteners, such as terminal screws, which are structured to fasten and electrically connect electrical conductors to the generally planar member. The test lead assembly includes an extension member having first and second opposing ends, and an intermediate portion extending therebetween. The first end is fastened to the enlarged head of a corresponding one of the terminal screws. A connection element is disposed at or about the second end of the extension member. In one embodiment the connection element is a thumb screw that electrically connects a test element to the extension member. The test lead assembly enables the terminal board to be tested, without loosening or otherwise disturbing the electrical connections of the terminal board. An associated method is also disclosed.

The present disclosure relates to an apparatus for testing an object, the apparatus including a guide means and a testing means, and capable of easily and quickly testing an object from a position where an operator wants, and of testing an object from various positions, thereby significantly improving the testing efficiency, and also having a simple configuration so that it is easy to manufacture and maintain at reduced cost.

The present disclosure relates to an apparatus for testing an object, the apparatus including a guide means and a testing means, and capable of easily and quickly testing an object from a position where an operator wants, and of testing an object from various positions, thereby significantly improving the testing efficiency, and also having a simple configuration so that it is easy to manufacture and maintain at reduced cost.

The invention provides an online monitoring, early warning and real-time processing system for farmland heavy metal pollution. The system comprises a heavy metal online monitoring and early warning subsystem, a heavy metal real-time processing device and a control processing device; the heavy metal online monitoring and early warning subsystem and the heavy metal real-time processing device are respectively connected with the control processing device; the heavy metal online monitoring and early warning subsystem is used for monitoring heavy metal concatenation of soil and sending an early warning signal according to the severity of the soil pollution; the control processing device is used for receiving and analyzing the early warning signal and sending a control command; the heavy metal real-time processing device is used for receiving the control command and performing adsorbing treatment on the heavy metals.

An array test apparatus includes a signal transmission unit which transmits a data signal to each of a plurality of data lines of a low-temperature polysilicon (“LTPS”) substrate, a signal measurement unit which measures the data signal of each of the data lines of the LTPS substrate, a timer which generates a horizontal period for setting a section in which the data signal is transmitted from the signal transmission unit to each of the data lines and a section in which the data signal output from each of the data lines is measured by the signal measurement unit, and a determination unit which determines whether each of the data lines of the LTPS substrate is normal based on the data signal measured by the signal measurement unit.

The invention discloses an on-site uninterruptible power supply automatic test method for an on-site feeder automation switch terminal, and relates to the technical field of distribution automation. The on-site uninterruptible power supply automatic test method for an on-site feeder automation switch terminal is suitable for on-site automatic test of on-site feeder automation equipment such as a voltage-time type, a voltage-current time type, a national grid adaptive type, a voltage-current time + relay protection type and a closing quick-break type. The on-site uninterruptible power supply automatic test method for an on-site feeder automation switch terminal uses a feeder automatic intelligent tester with a programmable function and a feeder condition switch adaptive simulator to complete the automatic test of the related functions and technical indicators of a power distribution switch terminal during the overall process of fault occurrence, fault judgment, fault isolation and non-faulty area power restoration for the fault occurrence position in various situations, such as the upstream, the downstream and irrelevant branches of the tested power distribution switch terminal under the transient fault and permanent fault conditions for one time when the tested switch device is running normally without power failure, at the same time, automatically generates a test report, andcan store, output or upload the test report to a cloud platform.