2113results about "Special purpose recording/indication apparatus" patented technology

Various embodiments of the present invention provide a flow meter device having a laser Doppler anemometer (LDA) which measures the instantaneous center line velocity of fluid flow in a pipe. The flow meter may process the instantaneous velocity so obtained to compute the volumetric flow rate, mass rate, and / or other flow characteristics (e.g., as instantaneous quantities and / or integrated over a time interval) The flow meter may use an electronic processing method. The electronic processing method may provide essentially an exact solution to the Navier-Stokes equations for any periodically oscillating flow.

A method, information processing system, and computer program storage product for associating jobs with resource subsets in a job scheduler. At least one job class that defines characteristics associated with a type of job is received. A list of resource identifiers for a set of resources associated with the job class is received. A set of resources available on at least one information processing system is received. The resource identifiers are compared with each resource in the set of resources available on the information processing system. A job associated with the job class with is scheduled with a set of resources determined to be usable by the job based on the comparing.

Methods and systems for inspection of wafers and reticles using designer intent data are provided. One computer-implemented method includes identifying nuisance defects on a wafer based on inspection data produced by inspection of a reticle, which is used to form a pattern on the wafer prior to inspection of the wafer. Another computer-implemented method includes detecting defects on a wafer by analyzing data generated by inspection of the wafer in combination with data representative of a reticle, which includes designations identifying different types of portions of the reticle. An additional computer-implemented method includes determining a property of a manufacturing process used to process a wafer based on defects that alter a characteristic of a device formed on the wafer. Further computer-implemented methods include altering or simulating one or more characteristics of a design of an integrated circuit based on data generated by inspection of a wafer.

A system and method that utilizes direct sequence spread spectrum signal (DSSS) encoding to enable testing of a live wire, wherein an original data signal is modified and then transmitted along the wire, and a reflected signal is collected and analyzed using correlation techniques to determine characteristics of the live wire, including the location of a fault.

Systems and methods for development testing of vehicles and components are disclosed. In one embodiment, a system includes a position reference system and a command and control architecture. The position reference system is configured to repetitively measure one or more position and motion characteristics of one or more vehicles operating within a control volume. The command and control architecture is configured to receive the repetitively measured characteristics from the position reference system, and to determine corresponding control signals based thereon. The control signals are then transmitted to the one or more vehicles to control at least one of position, movement, and stabilization of the one or more vehicles in a closed-loop feedback manner. The system may further include a health monitoring component configured to monitor health conditions of the one or more vehicles, the control signals being determined at least in part on the health conditions.

The invention disclosed herein provides methods and materials for observing the state of a sensor, for example those used by diabetic patients to monitor blood glucose levels. Typically a voltage such as a voltage pulse is applied to the sensor in order to solicit a current response from which for example, factors such as impedance values can be derived. Such values can then be used as indicators of a sensor's state, for example the state of sensor hydration, sensor noise, sensor offset, sensor drift or the like.

Various methods, designs, defect review tools, and systems for determining locations on a wafer to be reviewed during defect review are provided. One computer-implemented method includes acquiring coordinates of defects detected by two or more inspection systems. The defects do not include defects detected on the wafer. The method also includes determining coordinates of the locations on the wafer to be reviewed during the defect review by translating the coordinates of the defects into the coordinates on the wafer such that results of the defect review performed at the locations can be used to determine if the defects cause systematic defects on the wafer.

A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.

A chopped Hall effect sensor topology includes a switched Hall plate, an amplifier responsive to an output of the switched Hall plate and a filter stage responsive to the output of the amplifier and including an anti-aliasing filter and a selective filter that is tuned to the modulation frequency. The switched Hall plate includes a Hall element and a Hall plate modulation circuit that modulates the Hall offset signal component or the magnetic signal component. In embodiments in which the Hall offset signal component is modulated by the switched Hall plate, the amplifier, if chopped, includes an even number of additional modulation circuits. In embodiments in which the magnetic signal component is modulated by the switched Hall plate, the amplifier contains an odd number of modulation circuits. The described topology provides a low noise, fast response time Hall effect sensor.

A large number of properties of nanostructures depend on their size, shape and many other parameters. As the size of a nanostructure decreases, there is a rapid change in many properties. When the nanostructure is completely destroyed, those properties essentially disappear. Systems based on changes in properties of nanostructures due to the destruction of nanostructures are proposed. The systems can be used for monitoring the total exposure to organic, inorganic, organometallic and biological compounds and agents using analytical methods.

Network device testing equipment capable of testing network devices using small size packets and for a transferring ability and a filtering ability at a media speed is described. A configuration is adopted in which a Field Programmable Gate Array (FPGA) included in a transmitter or receiver on one or both of transmitting and receiving sides is connected directly to a physical layer chip of a network and computers on both the transmitting and receiving sides are connected thereto. Each of the FPGAs of the transmitter and receiver has a circuit which has an integrated function of transmitting a packet pattern generation function and a packet-receiving function, thereby enabling a test and an inspection in real time. When inspecting the filtering function, a hash table storing therein a hash value and a list of occurrence frequencies for hash values is utilized. In order to avoid the hash values of different packets from having a same value, the hash function is configured so as to avoid that the same hash value is given to different packets or, when packet values have a common hash value, the packet is re-shaped into a packet having a different hash value.

A chopped Hall effect sensor topology includes a switched Hall plate, an amplifier responsive to an output of the switched Hall plate and a filter stage responsive to the output of the amplifier and including an anti-aliasing filter and a selective filter that is tuned to the modulation frequency. The switched Hall plate includes a Hall element and a Hall plate modulation circuit that modulates the Hall offset signal component or the magnetic signal component. In embodiments in which the Hall offset signal component is modulated by the switched Hall plate, the amplifier, if chopped, includes an even number of additional modulation circuits. In embodiments in which the magnetic signal component is modulated by the switched Hall plate, the amplifier contains an odd number of modulation circuits. The described topology provides a low noise, fast response time Hall effect sensor.

A method is designed for measuring a magnetic offset of a geomagnetic sensor equipped in a portable information terminal apparatus having a storage. The geomagnetic sensor has a magnetic sensitivity to a geomagnetic field and is affected by magnetization to cause the magnetic offset. In the method, an output of the geomagnetic sensor is measured to successively provide measurement data of the geomagnetic field from the output of the geomagnetic sensor. The measurement data is stored in the storage. The measurement data is read out from the storage when a number of the measurement data stored in the storage reaches a predetermined number, and an offset value of the magnetic offset is estimated based on the predetermined number of the measurement data read out from the storage.

A three-dimensional application program framework structure; a method for implementing an application program based on the same; and an automatic testing system based on a three-dimensional application software framework and a method therefor. The three-dimensional application program framework structure provides a framework comprising functions and management of the environment of the system and events to be implemented by the user (developer), and the developer can easily expand the graphic user interface (GUI) and an actual modeling function as required, and user model. In addition, by using an automatic test system based on the framework, it is possible to record the function-execution history of the user and to automatically generate a test case, and to thereby test the functioning of the application software through the use of the test case regardless of changes in the source code and the GUI.

A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.

A method and system for test automation is described. The method may include creating a test case on a client computer; generating expected testing results by manually executing the test case on a computer system; performing automated testing on the computer system using the test case to generate automated testing results; validating the test case by comparing the automated testing results with the expected testing results; marking the test case as automatable, if the automated testing results match the expected testing results; and storing the automatable test case for later execution.

A method is provided, the method comprising sampling at least one parameter characteristic of processing performed on a workpiece in at least one processing step, and modeling the at least one characteristic parameter sampled using an adaptive sampling processing model, treating sampling as an integrated part of a dynamic control environment, varying the sampling based upon at least one of situational information, upstream events and requirements of run-to-run controllers. The method also comprises applying the adaptive sampling processing model to modify the processing performed in the at least one processing step.

Arrangement and method for managing set-top boxes used by customers of a content service provider includes at least one automated tester each arranged to couple to set-top boxes and subject each set-top box to a series of automated tests to determine whether each set-top box is functioning properly or requires subsequent repair, and a processor unit coupled to each automated tester for receiving test results therefrom and monitoring testing of set-top boxes via the automated tester(s). Each automated tester is located at a testing facility maintained by the content service provider. A database stores the test results from the automated tester(s) and enables generation of customized reports about the set-top boxes tested by the automated tester(s). A billing system is coupled to each automated tester and to the processor unit and coordinates invoicing for testing performed by the automated tester(s) and repair of set-top boxes at a repair facility.

Present invention is to provide a method and apparatus for controlling energy expanding of sensor network nodes, wherein the method comprises steps of: acquiring energy information, said energy information being indicative of an energy status of a node in the network; and adjusting at least one data transmission parameter accordingly based on the energy information. With present invention, on the premise that the communication capacity and power energy of sensor nodes are limited in a wireless sensor network, it is capable of efficiently utilize the network resource, save the power consumption of sensor node, and prolong the whole life of sensor network.