381results about "Manufacture testing/measurements" patented technology

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

In a method of a manufacturing flat display apparatuses by working flat substrates, a flat substrate is prepared having a first region which is used as a flat display apparatus and a second region outside the first region. After the first region is worked as desired, the second region is cut and separated from the flat substrate.

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

The present invention relates to the adjustment of luminance. The present invention is a method of manufacturing image forming apparatus including a step of applying characteristic shift voltage comprising a plurality of pulses in which the amplitude of the pulse obtained from the look-up table has two or more values, to the emitter, the look-up table storing the amplitude of the pulse and the number of the pulse for shifting characteristic of emitters to a predetermined luminance target value on the basis of the measurement result of the luminance. Moreover, the present invention is a method of manufacturing image forming apparatus comprising a step of applying the second pulses of characteristic shift voltage having the amplitude which was determined in response to the measurement result of the luminance after the first characteristic shift voltage had been applied to the emitter.

The invention provides a defect inspection device and a defect inspection method. An imaging unit (3) images an object to be inspected to generate imaging information. An image generating unit (4) generates an image of an object to be inspected based on imaging information. A defect extraction unit (5) extracts defects on the object to be inspected using the generated image. A defect inspection unit (6) inspects the extracted defects and generates inspection results for each inspection condition. The inspection result generation unit (10) weights the inspection results under each inspection condition according to the defect-related information, and integrates the inspection results under each inspection condition on this basis. Accordingly, it is possible to provide a defect inspection device and a defect inspection method capable of improving the productivity of the entire manufacturing process by facilitating the pass / fail judgment of the substrate.

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

The invention provides a glass sheet defect detection device to rapidly, effectively, and accurately detect various defects generated inside or on the surface of a glass sheet. The glass sheet defect detection device (10) includes a light source (20) and a light reception device (30) which are arranged at opposite positions so as to sandwich a glass sheet (G). The glass sheet (G) has light transmission surfaces (Ga, Gb) to oppose each other in the thickness direction. The glass sheet (G) is arranged between the light source (20) and the light reception device (30) so that the light transmission surfaces (Ga, Gb) are inclined against a light axis (Lx) of an optical system of the glass sheet defect detection device (10) by a predetermined angle a. Moreover, the light reception device (30) and the glass sheet (G) are arranged with such a positional relationship that a focal distance (F) of a lens system (31) of the light reception device (30) is smaller than a distance (Z) between the light reception element of the light reception device (30) and the glass sheet (G).

A charged particle optical system for testing, imaging or inspecting substrates comprises: a charged particle optical assembly configured to produce a line of charged particle beams equally spaced along a main scan axis, each beam being deflectable through a large angle along the main scan axis; and linear detector optics aligned along the main scan axis. The detector optics includes a linear secondary electron detector, a field free tube, voltage contrast plates and a linear backscattered electron detector. The large beam deflection is achieved using an electrostatic deflector for which the exit aperture is larger than the entrance aperture. One embodiment of the deflector includes: two parallel plates with chamfered inner surfaces disposed perpendicularly to the main scan axis; and a multiplicity of electrodes positioned peripherally in the gap between the plates, the electrodes being configured to maintain a uniform electric field transverse to the main scan axis.