381results about "Manufacture testing/measurements" patented technology

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

The invention provides a glass sheet defect detection device to rapidly, effectively, and accurately detect various defects generated inside or on the surface of a glass sheet. The glass sheet defect detection device (10) includes a light source (20) and a light reception device (30) which are arranged at opposite positions so as to sandwich a glass sheet (G). The glass sheet (G) has light transmission surfaces (Ga, Gb) to oppose each other in the thickness direction. The glass sheet (G) is arranged between the light source (20) and the light reception device (30) so that the light transmission surfaces (Ga, Gb) are inclined against a light axis (Lx) of an optical system of the glass sheet defect detection device (10) by a predetermined angle a. Moreover, the light reception device (30) and the glass sheet (G) are arranged with such a positional relationship that a focal distance (F) of a lens system (31) of the light reception device (30) is smaller than a distance (Z) between the light reception element of the light reception device (30) and the glass sheet (G).

A charged particle optical system for testing, imaging or inspecting substrates comprises: a charged particle optical assembly configured to produce a line of charged particle beams equally spaced along a main scan axis, each beam being deflectable through a large angle along the main scan axis; and linear detector optics aligned along the main scan axis. The detector optics includes a linear secondary electron detector, a field free tube, voltage contrast plates and a linear backscattered electron detector. The large beam deflection is achieved using an electrostatic deflector for which the exit aperture is larger than the entrance aperture. One embodiment of the deflector includes: two parallel plates with chamfered inner surfaces disposed perpendicularly to the main scan axis; and a multiplicity of electrodes positioned peripherally in the gap between the plates, the electrodes being configured to maintain a uniform electric field transverse to the main scan axis.