381results about "Manufacture testing/measurements" patented technology

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

In a method of a manufacturing flat display apparatuses by working flat substrates, a flat substrate is prepared having a first region which is used as a flat display apparatus and a second region outside the first region. After the first region is worked as desired, the second region is cut and separated from the flat substrate.

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

An improved light-emitting panel having a plurality of micro-components sandwiched between two substrates is disclosed. Each micro-component contains a gas or gas-mixture capable of ionization when a sufficiently large voltage is supplied across the micro-component via at least two electrodes. A method of testing a light-emitting panel and the component parts therein is also disclosed, which uses a web fabrication process to manufacturing light-emitting panels combined with inline testing after the various process steps of the manufacturing process to produce result which are used to adjust the various process steps and component parts.

The present invention relates to the adjustment of luminance. The present invention is a method of manufacturing image forming apparatus including a step of applying characteristic shift voltage comprising a plurality of pulses in which the amplitude of the pulse obtained from the look-up table has two or more values, to the emitter, the look-up table storing the amplitude of the pulse and the number of the pulse for shifting characteristic of emitters to a predetermined luminance target value on the basis of the measurement result of the luminance. Moreover, the present invention is a method of manufacturing image forming apparatus comprising a step of applying the second pulses of characteristic shift voltage having the amplitude which was determined in response to the measurement result of the luminance after the first characteristic shift voltage had been applied to the emitter.

The invention provides a defect inspection device and a defect inspection method. An imaging unit (3) images an object to be inspected to generate imaging information. An image generating unit (4) generates an image of an object to be inspected based on imaging information. A defect extraction unit (5) extracts defects on the object to be inspected using the generated image. A defect inspection unit (6) inspects the extracted defects and generates inspection results for each inspection condition. The inspection result generation unit (10) weights the inspection results under each inspection condition according to the defect-related information, and integrates the inspection results under each inspection condition on this basis. Accordingly, it is possible to provide a defect inspection device and a defect inspection method capable of improving the productivity of the entire manufacturing process by facilitating the pass / fail judgment of the substrate.

In a method of manufacturing a display apparatus, an opposite substrate on which a conductive pattern is formed is coupled with a display substrate to face the display substrate, and the opposite substrate is cut to partially expose the display substrate. Since the conductive pattern is cut with the opposite substrate during the cutting of the opposite substrate, an electric resistance of the conductive pattern is changed. The change in electric resistance of the conductive pattern is detected to determine whether the opposite substrate is cut or not.

A charged particle optical system for testing, imaging or inspecting substrates comprises: a charged particle optical assembly configured to produce a line of charged particle beams equally spaced along a main scan axis, each beam being deflectable through a large angle along the main scan axis; and linear detector optics aligned along the main scan axis. The detector optics includes a linear secondary electron detector, a field free tube, voltage contrast plates and a linear backscattered electron detector. The large beam deflection is achieved using an electrostatic deflector for which the exit aperture is larger than the entrance aperture. One embodiment of the deflector includes: two parallel plates with chamfered inner surfaces disposed perpendicularly to the main scan axis; and a multiplicity of electrodes positioned peripherally in the gap between the plates, the electrodes being configured to maintain a uniform electric field transverse to the main scan axis.

An optical device capable of illuminating visual light with adjusting color temperature after fabrication is disclosed. The optical device includes a solid state light emitter and a phosphor layer, which is formed over the solid state light emitter. The solid state light emitter, which can be a light emitter diode (“LED”), converts electrical energy to blue light. The phosphor layer subsequently converts first light with a first wavelength to second light with a second wavelength. In one example, the first light is blue light while the second light is white light. A portion of the phosphor layer is adjusted after the phosphor layer is formed for adjusting color of the white light in accordance with color quality of the light detected by a light detector.

The invention provides a glass sheet defect detection device to rapidly, effectively, and accurately detect various defects generated inside or on the surface of a glass sheet. The glass sheet defect detection device (10) includes a light source (20) and a light reception device (30) which are arranged at opposite positions so as to sandwich a glass sheet (G). The glass sheet (G) has light transmission surfaces (Ga, Gb) to oppose each other in the thickness direction. The glass sheet (G) is arranged between the light source (20) and the light reception device (30) so that the light transmission surfaces (Ga, Gb) are inclined against a light axis (Lx) of an optical system of the glass sheet defect detection device (10) by a predetermined angle a. Moreover, the light reception device (30) and the glass sheet (G) are arranged with such a positional relationship that a focal distance (F) of a lens system (31) of the light reception device (30) is smaller than a distance (Z) between the light reception element of the light reception device (30) and the glass sheet (G).

A charged particle optical system for testing, imaging or inspecting substrates comprises: a charged particle optical assembly configured to produce a line of charged particle beams equally spaced along a main scan axis, each beam being deflectable through a large angle along the main scan axis; and linear detector optics aligned along the main scan axis. The detector optics includes a linear secondary electron detector, a field free tube, voltage contrast plates and a linear backscattered electron detector. The large beam deflection is achieved using an electrostatic deflector for which the exit aperture is larger than the entrance aperture. One embodiment of the deflector includes: two parallel plates with chamfered inner surfaces disposed perpendicularly to the main scan axis; and a multiplicity of electrodes positioned peripherally in the gap between the plates, the electrodes being configured to maintain a uniform electric field transverse to the main scan axis.

Method and apparatus for inspecting pattern defect can inspect printing defects of fluorescent substances formed on a glass substrate such as a plasma display panel and the like automatically and rapidly without being affected by a coating pattern of the fluorescent substances, and can be installed easily in manufacturing process of the plasma display panel to thereby achieve a low cost and high speed detection. In case of inspecting the pattern defect, stripe-form pattern of the fluorescent substances formed on the glass substrate are scanned, and then a direction of the stripe-form pattern of the fluorescent substances are detected from picture signals obtained by the scanning, and then the pattern defect is inspected by comparing at least two picture data with each other, the picture data being related to the direction of the stripe-form pattern.

Large digital displays for entertainment, architectural and advertising displays have interconnected display panels with pluralities of light emitting elements. To solve calibration problems, each of the display panels stores measured luminance and chromaticity data for each of the light emitting elements of the panel. The luminance data is independent of the chromaticity data. A central controller can then perform calibration procedures so that the light emitting elements are matched across the entire display.

The present invention discloses a substrate clamping device and substrate transmitting device, used for mechanically fixing one side of the substrate and transferring the substrate through vac sorb. The substrate clamping device includes: a upper chuck; a lower chuck, wherein the structure is to put in and clamp the substrate between the upper chuck and the lower chuck; and a vacuum nozzle, to construct to adsorb and fixing the substrate on at least one of the upper chuck and the lower chuck opposite each other, so the substrate fixed by the substrate clamping device is separated during the transport process or scratched on the contact surface are prevented. When the substrate clamped by the substrate clamping device transmits rapidly, the invention prevents the substrate and the substrate clamping device separate and so assure the reliability of the substrate transmitting and advances the productivity of the product.

The method to detect plasma display screen defect comprises: obtaining the screen surface image with high-resolution camera for threshold treatment; taking differential minus treatment to the treated image with preset standard image; detecting defect point according to detection condition. This invention needs no repeated calculation, and also fit to nonperiodic image.