244results about "Spark gaps adjustment" patented technology

A dark spot defect of an EL element is detected based on an emission brightness or a current flowing through the EL element when an element driving transistor which controls a drive current to be supplied to the EL element is operated in its linear operating region and the EL element is set to an emission level. A dim spot defect caused can be detected based on a current flowing through the EL element when the element driving transistor is operated in its saturation operating region and the EL element is set to the emission level. When an abnormal display pixel is detected based on an emission brightness, a pixel which is determined as an abnormal display pixel and which is not determined as a dark spot defect is determined, and the pixel is detected as a dim spot defect caused by the characteristic variation of the element driving transistor.

Disclosed herein are apparatus, methods, and systems for deriving composite beams from a plurality of light sources such as LEDs. Optical units comprising a plurality of light sources, each source having an associated optic which is individually positionable, are developed using optimization techniques that allow for lighting different target areas in an effective manner by rotating or otherwise positioning the reflectors, refractive lenses, TIR lenses, or other lens types to create a composite beam. The apparatus, methods, and systems of lighting herein make it possible to widely vary the types of beams from an available fixture using a small number of optics and fixtures. In some cases, by using a combination of individual beam patterns from the same or different types of light sources, a small set of individual optics may be sufficient to create a majority of the typical and specialized composite beams needed to meet the needs of most lighting projects and target areas.

A light emitting diode (LED) illuminant system, a manufacture method thereof, and a backlight module using the same are provided. The LED illuminant system includes a plurality of white light illuminants and at least one green light illuminant mixed in the white light illuminants. A light power ratio of the green light illuminant to the white light illuminants is in between ⅕ to 1 / 20. The color temperature of the whole illuminant system will be enhanced to a certain extent by mixing the green light illuminant and the white light illuminants. The manufacture method includes the following steps: obtaining a transmission spectrum of the white light illuminants; analyzing the transmission spectrum to determine n supplemental amount of a green light; and disposing at least one green illuminant in accordance with the supplemental amount of the green light.

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

In a method of a manufacturing flat display apparatuses by working flat substrates, a flat substrate is prepared having a first region which is used as a flat display apparatus and a second region outside the first region. After the first region is worked as desired, the second region is cut and separated from the flat substrate.

A method of testing a light-emitting panel and the component parts therein including an assembled web containing light-emitting micro-components is disclosed. The method utilizes radiometric measuring devices disposed throughout a continuous fabrication process. Qualities of the components are measured so that product defects or process deficiencies can be corrected or eliminated.

The present invention relates to the adjustment of luminance. The present invention is a method of manufacturing image forming apparatus including a step of applying characteristic shift voltage comprising a plurality of pulses in which the amplitude of the pulse obtained from the look-up table has two or more values, to the emitter, the look-up table storing the amplitude of the pulse and the number of the pulse for shifting characteristic of emitters to a predetermined luminance target value on the basis of the measurement result of the luminance. Moreover, the present invention is a method of manufacturing image forming apparatus comprising a step of applying the second pulses of characteristic shift voltage having the amplitude which was determined in response to the measurement result of the luminance after the first characteristic shift voltage had been applied to the emitter.

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.

A method of forming micro-components is disclosed. The method includes pretesting and conditioning of the micro-components. The micro-components that fail testing or conditioning are discarded, and those remaining are assembled into a panel.