The invention discloses an FPGA
aging test system and a circuit configuration method thereof. The FPGA
aging test system comprises multiple aging boards, a power
distribution board and a configurationand monitoring board, wherein the multiple aging boards are placed in an aging temperature box, each aging board comprises a plurality of
FPGA chip sockets, a power supply interface and a
crystal vibrator, and excitation is provided for the aging board; the power
distribution board is placed outside the aging temperature box and provides multi-way independent power for each aging board; and the configuration and monitoring board is arranged outside the aging temperature box and comprises a PROM configuration
chip. In the
aging test, a plurality of different FPGA chips are placed in the
FPGA chip sockets in the aging board and through the PROM configuration
chip of the configuration and monitoring board, one PROM is controlled to simultaneously configure the plurality of different FPGA chips in a passive serial mode. The
system is applicable to different FPGA chips with the same packaging, universality is realized, the number of required nonvolatile storage devices is saved, and through introducing a state
monitoring system and
safety assurance measures, the
chip state during the aging process can be monitored in real time.