The invention provides a built-in endurance test
system, an
aging test device and a corresponding endurance test method. The built-in endurance test
system comprises a power supply end, a grounding end, a
clock end and an output end; the built-in endurance test
system is started through the power supply end, the grounding end and the
clock end, and carries out the endurance test to a
chip and outputs the endurance test results through the output end; the
aging test device comprises a whole
machine test plate, at least a group of chips, the built-in endurance test system, a decoder and terminal
test equipment, wherein the chips are arranged on the whole
machine test plate; the built-in
endurance testing system is integrated in each
chip; the decoder is used for receiving the endurance test results output by the built-in endurance test system; the terminal
test equipment is used for determining the chips which can not realize the endurance test according to the decoding results output by the decoder, so as to solve the problems that the sample quantity is less, the endurance test period is long, whether the reading
kinetic energy of a
chip sample is invalid or not can not be judged automatically, and the test cost is expensive during endurance test of each batch chips.