47results about How to "Scan stable" patented technology

An inventory management system using an automated guided vehicle that moves back and forth along a guideline and that scans articles on shelves is introduced. The inventory management system may comprise: a scanning unit for recognising information about articles stacked on shelves; a guideline following a plurality of spaced apart shelves; a vehicle for supporting the scanning unit and for moving along the guideline by recognising the guideline; and a control unit for controlling the vehicle such that the vehicle can move along the guideline that is recognised using a line recognition part.

A transmission optical system comprises a concave surface mirror whose reflection surface is directed toward a deflection mirror surface and a transmission lens which is disposed between the concave surface mirror and the deflection mirror surface. A light beam deflected by a deflecting element at a first deflection angle is guided to the concave surface mirror via the transmission lens, and the light beam returned by the concave surface mirror is guided to the deflecting element via the transmission lens. In consequence, the deflecting element reflects the light beam twice, and the light beam is emitted toward a scanning lens at a second deflection angle which is larger than the first deflection angle.

The invention discloses a total internal reflection microscopy device based on free-form surface shaping.The device comprises a light source and a line polarized light generating module, a free-form surface focusing module, a digital microscopy refection module, an optical enlargement transmission module and a fluorescence imaging module which are sequentially arranged along a light path, wherein the line polarized light generating module is used for converting light beams emitted by the light source into line polarized light; the free-form surface focusing module is used for converting the line polarized light into annular focused light; the digital microscopy refection module is used for selecting annular focused light reflected in an area; the optical enlargement transmission module is used for achieving total internal reflection illumination of the light beams; the fluorescence imaging module is used for exciting a sample to emit fluorescent light and collecting a fluorescent light signal image.The invention further discloses a total internal reflection microscopy method based on free-form surface shaping.According to the total internal reflection microscopy method and device based on free-form surface shaping, no mechanical vibration module is adopted, scanning is conducted more stably, and noise is lower; the utilization rate of laser energy is higher, and an imaging view field is more uniform; a DMD control controls scanning, the angle is more accurate, and it is helpful to achieve layered scanning and 3D image reconstruction.