Whole-course quality control device of pathological section image and pathological section analysis device
A technology for pathological slices and analysis devices, which is applied to measurement devices, analysis materials, medical images, etc., can solve the problems of incomplete analysis features, lack of global awareness of slice images, and many types of specimens.
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[0030] The technical features in the technical solutions provided by the present invention will be further clearly and completely described below in conjunction with specific embodiments.
[0031] Pathological slice image quality control device The image quality control system based on AI algorithm runs through all aspects of the scanner, assisting in the detection, counting, inspection and classification of cells on slides.
[0032] The first aspect of the present invention provides a whole process quality control device 100 for pathological slice images, such as figure 1 As shown, it includes: a slide detection unit 101, a scanning layer number selection unit 102 and an image quality scoring unit 103, each unit is electrically connected in turn; the slide detection unit 101 is used to detect and calculate current slide information for scanning layers The number selection unit 102 automatically selects or specifically increases the number of scanning layers for scanning. Afte...
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