The invention discloses a photoetching hot area detection method based on federal
personalized learning. The method comprises the following steps that
global model parameters returned by each node by a central
server are aggregated, common characteristics of each node are fused, the
global model parameters are updated, and the latest
global model parameters to each node are fed back; each node downloads a global
model parameter from the central
server, and then trains a local
model parameter by using local data to find the optimal local
model parameter under the current global model parameter so as to overcome model heterogeneity and
data heterogeneity of different nodes; and after the local
model parameters are finely adjusted, the nodes
train all the parameters by using local data to find the optimal current parameters for searching common features of different nodes. According to the method, the problem of model
overfitting caused by too little local data is solved; data between
chip design manufacturers is protected, and
privacy protection is achieved; and the stability and the overall precision of the federal
personalized learning model in the heterogeneous environment are improved.