A data latch circuit includes anti-fuse elements for storing remedy information therein as to replacement of defective memory cells by redundant memory cells. For
programming the anti-fuse elements to a
logic level "1" in a
programming mode, control signals CTL1 and CTL2 are set at a low level and a high level, respectively, and
programming control signals PGMA and PGMB are set at a high level and a low level, respectively. A
voltage selection node Nvs delivers a programming
voltage Vpp, lowering an output terminal RCB to effect
dielectric breakdown of anti-fuse element 25, which assumes a
low resistance. In a normal
operation mode, programming voltages PUMA and PGMB are set at a low level and a high level, respectively, and both control signals CTL1 and CTL2 are set at a low level
Voltage output node Nvs delivers the normal
operating voltage, raising output terminal RC to a high level to thereby deliver the stored
logic level "1".