A semi-
adaptive voltage scaling method and device for determining minimal supply voltages for digital electronic
semiconductor circuitry, e.g., microprocessors, of electronic devices under
production testing and “real” operating conditions. The SAVS operates in a closed-loop during a production
test phase of the circuitry and in an open-loop mode in an application (operation) phase of the
semiconductor circuitry. During
production testing, a lowermost level of the supply
voltage for the
semiconductor circuitry is determined at one single defined temperature at which operating specifications of the circuit are met. The lowermost level is stored in a dedicated
electronic memory of the circuitry together with temperature dependent parameters. Afterwards, when the digital electronic circuitry is operated in a “real” application, e.g., a
mobile phone, the device and method reads the previously measured and proven data from the memory and regenerates the minimum level of supply
voltage for the circuitry, taking into account the actual temperature of the application. As a result, the digital semiconductor circuitry in the “real” application is supplied with a minimum level of supply
voltage, whereby specified parameters of the circuitry are met. Thus, a
power consumption of the circuitry is advantageously reduced to a minimum.