The invention relates to a photoelectric response characteristic calibration method for a two-dimensional imaging device, which comprises a
ray diffraction grating, a focusing optical
system, a two-dimensional imaging device to be calibrated and a computer
system, wherein an incident
light beam for calibrating the two-dimensional imaging device is a
light beam parallel to the plane, the
light beam is imaged on the photosensitive surface of the two-dimensional imaging device after being modulated by the space intensity of the
ray diffraction grating and being converged by the focusing optical
system, the incident light beam forms a series of
diffraction sub light spots with modulated
light intensity on the photosensitive surface of the two-dimensional imaging device through the
beam splitting characteristic of the
ray diffraction grating, a plurality of groups of measured data are fused through
peak value measuring data of each diffraction sub
light spot and
peak value theoretical dataobtained by theoretical calculation, the measured data and the corresponding theoretical data are obtained, the two groups of data are combined for completing the photoelectric response characteristic calibration of the two-dimensional imaging device. The photoelectric response characteristic calibration method has high
light energy utilization rate, is applicable to the photoelectric response characteristic calibration of the two-dimensional imaging device under the condition with strong light sources and is also applicable to weak light sources, and the calibration range is enlarged throughthe fusion of a plurality of groups of measured data.