137 results about "Thermal probe" patented technology

The invention pertains to a multi-functional cooker having a thermal probe operatively connected to a controller for controlling a heating element in response to a real-time temperature reading from the probe. By controlling the level of heat provided by the heating element in response to real-time temperature readings, optimal comestible flavor may be achieved. The multi-functional cooker also includes a hinged lid for directing fluid on an inner surface of the lid into a cooking vessel of the invention upon opening of the lid.

A platinum / Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few mum3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.

A platinum / Rhodium resistance thermal probe is used as an active device which acts both as a highly localized heat source and as a detector to perform localized differential calorimetry, by thermally inducing and detecting events such as glass transitions, meltings, recystallizations and thermal decomposition within volumes of material estimated at a few mu m3. Furthermore, the probe is used to image variations in thermal conductivity and diffusivity, to perform depth profiling and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample.

An apparatus and method for treating an intervertebral disc having an inner nucleus pulpous and an outer annulus fibrous includes a thermal probe defining proximal and distal ends and having a guidable region adjacent the distal end thereof. The guidable region is characterized by having sufficient rigidity to advance within the annulus fibrous of the intervertebral disc in response to an axial force exerted on the proximal end of the thermal probe while having sufficient flexibility to substantially follow and conform to an azimuthal course defined by the natural striata of the annulus fibrous. The thermal probe is adapted for connection to a thermal energy source to provide thermal energy to the annulus fibrous to alleviate pain associated with the intervertebral disc.

An apparatus and method for thermally destroying tumors in which heat is generated by electrical resistance heating conducted to the target tissue. Computerized scanning is used to optimize the geometry of a thermal probe. The probe has a metal tip heated by a remote laser. The metal tip is mounted on the end of a wave guide fiber for transmitting the laser radiation to the metal tip. The tip is coated with a thin layer of biocompatible ceramic to avoid coagulated tissue sticking to the tip. The tip has one or more thin, thermally-conductive elements which deploy in stages to coagulate the tumor. The conductive elements may be thin wires or blades. On one embodiment, the conductive elements are composed of a shape memory material that is folded against the tip at lower temperatures and deploys at selected higher temperatures. In another embodiment, the conductive elements are blades that are deployed mechanically. The tip may be provided with a miniature thermocouple to provide temperature feedback information.

An open probe method for sample introduction into a mass spectrometer is disclosed, comprising the steps of: loading a sample holder with sample compounds to be analyzed; heating a probe oven; introducing said sample compounds in said sample holder into said heated probe oven; flowing inert gas into said heated probe oven; vaporizing said sample in said heated probe oven by the combined effect of oven temperature and inert gas flow; entraining said vaporized sample in said inert gas; and, transferring said vaporized sample in inert gas into an ion source of a mass spectrometer; wherein said heated probe oven remains open to the ambient atmosphere during sample introduction and analysis; said inert gas is flowing in said heated probe oven in two directions of a transfer line to a mass spectrometer ion source and to the oven opening; said vaporized sample in inert gas is transferred through a heated transfer line directly into the ionization chamber of an ion source of a mass spectrometer. An apparatus for this method of sample introduction is also disclosed. The primary advantage of this method and apparatus is that the heated probe oven remains open to the ambient atmosphere during sample introduction and analysis thereby enabling faster sample analysis.

A drive actuator for a measurement instrument having a probe, the drive actuator including a heating element in a thermally conductive relationship with the probe such that application of electric current to the heating element modifies a characteristic of the probe. The probe device includes a probe including a cantilever having a lever made of a material having a selected thermal expansivity and a drive actuator in operable cooperation with the cantilever lever made of a material having a thermal expansivity different than the thermal expansivity of the material of which the cantilever lever is made.

The present invention provides a light-emitting element light source comprising a system for sensing, and optionally managing, an operating temperature of the light source. In general, the light source comprises one or more light-emitting elements, which may be arranged in one or more groups, one or more arrays or one or more clusters thereof, operatively mounted to respective and / or common substrates. The one or more substrates each generally comprise circuitry operatively coupling the light-emitting element(s) mounted thereto to a light source driving mechanism configured to impart a drive current to the light-emitting element(s). The substrate(s) also comprises one or more thermal probes configured to thermally couple one or more respective and / or combinations of selected light-emitting elements to one or more temperature sensing elements such that an operating temperature of the selected light-emitting element(s) may be sensed, monitored, and optionally controlled in order to maintain desirable light source operating and / or output characteristics.

The invention is a heated thermal probe suitable for use in micro- thermal analysis or other high resolution thermal measurements and actions. The probe is, in the preferred embodiment, a microfabricated cantilever with a sharp probe tip of a type used in Scanning Probe Microscopes (SPM's) which further includes an integral resistive heating element. The heating element is formed by doping regions of the cantilever with an ion implant process to make lower resistance connections and a higher resistance heating element. There is no spatial overlap between the base of the probe tip and the heating element or conductors.

The invention discloses thermal conductivity measuring device and method. The heat conductivity measuring device comprises a thermal probe, a thermoelectric couple, a collector and a data processor, wherein the thermal probe is inserted into a sample to be measured for thermal conductivity measurement; the thermoelectric couple is used for measuring the wall surface temperature of the thermal probe; the collector is used for collecting the wall surface temperature measured by the thermoelectric couple and corresponding measuring time; and the data processor is used for combining a thermal conduction differential equation expressing wall surface temperature increase with the thermal conductivity of the sample to be measured, which is obtained by inversely processing the wall surface temperature and the corresponding measuring time. The invention sufficiently considers the thermal probe capacity, the thermal contact resistance between the thermal probe and the sample to be measured, and the like, thereby greatly enhancing the measurement accuracy of parameters, i.e. thermal conductivity and the like.

The present invention relates to devices and methods for measuring tissue temperature during thermal treatment of a body. More particularly, the present invention relates to a thermal probe comprising a plurality of thermal sensors operable to measure tissue temperatures during thermal treatments such as cryosurgery. Embodiments of the invention enable simultaneous measurements, using a single probe, of temperatures at a plurality of positions within body tissues. A preferred embodiment enables movement of sensors with respect to tissues while the probe is immobilized by being embedded in frozen tissue.

A temperature monitoring system for monitoring a temperature status of an item from a location different than a location at which the item is located is disclosed. The temperature monitoring system includes a base having a top surface and a bottom surface, and a first unit removably engageable with the top surface of the base in at least a first orientation and a second orientation. The first unit is configured to monitor a measured temperature, to display information regarding the measured temperature, and / or to transmit temperature information to a user device. The temperature monitoring system may also include at least one thermal or temperature probe configured to measure the temperature of the item, including a probe tip, probe wire, and probe plug. The temperature monitoring system may also include one or more probe supports configured to releasably attach to the base and configured to releasably retain a thermal probe thereon.

The invention discloses an atomic force microscope scanning thermal probe and a preparation method thereof. The obtained atomic force microscope scanning thermal probe comprises a probe cantilever, a probe tip, a graphene thin film layer and a low thermal conductivity layer, and the thermal conductivity of the low thermal conductivity layer ranges from 0.2 W / mK to 2 W / mK; the probe tip is located at one end of the probe cantilever, and the probe tip is coated with the graphene thin film layer which is coated with the low thermal conductivity layer, only the portion, corresponding to a probe tip body, of the graphene thin film layer is coated with the low thermal conductivity layer, and the portion, corresponding to the point of the probe tip, of the graphene thin film layer is not coated with the low thermal conductivity layer. By means of the atomic force microscope scanning thermal probe and the preparation method thereof, the accuracy and the resolution ratio of atomic force microscope thermal tests can be improved.

A system for heating a heat-transformable shape memory surgical device. The system includes a sealed, sterilizable housing, a thermal probe for heating the shape memory surgical device, the thermal probe being connected with the housing, and a printed circuit board positioned within the housing. The printed circuit board includes a system controller having a power circuit for controlling the receipt and distribution of heating power to the thermal probe, a feedback circuit for measuring a condition of the shape memory surgical device via the thermal probe, and a control circuit for receiving data from the feedback circuit and adjustably controlling an amount of heating power that the power circuit distributes to the thermal probe. The control circuit includes an automatic-cutout circuit for terminating the distribution of heating power to the thermal probe after a specific amount of time or upon the occurrence of a predetermined condition.

A temperature probe having a terminal attachment arrangement for securing and selectively releasing an electrical connection is disclosed. The temperature probe further includes a housing for sealing the temperature probe to a structure, such as a HVAC duct.

A drive actuator for a measurement instrument having a probe, the drive actuator including a heating element in a thermally conductive relationship with the probe such that application of electric current to the heating element modifies a characteristic of the probe. The probe device includes a probe including a cantilever having a lever made of a material having a selected thermal expansivity and a drive actuator in operable cooperation with the cantilever lever made of a material having a thermal expansivity different than the thermal expansivity of the material of which the cantilever lever is made.

A monitoring system such as a septic tank monitoring system for distinguishing between and identifying the location of a sedimentary layer, a scum layer, and any intervening liquid zone in a septic tank with an elongate sensing probe for being disposed in the septic tank, a plurality of sensors disposed along the sensing probe, and a remote monitor operably associated with the plurality of sensors, such as thermistors, for providing a remote indication to a septic tank operator of the location of the sedimentary layer, the scum layer, and any intervening liquid zone in the septic tank based on the signals from the plurality of sensors so that a septic tank operator can monitor the contents and condition of the septic tank without a need for excavating and physically inspecting the septic tank.

Systems and methods are described for identifying characteristics and defects in material such as semiconductors. Methods include scanning a thermal probe in the vicinity of a semiconductor sample, applying stimuli to the thermal probe, and monitoring the interaction of the thermal probe and the semiconductor. The stimulus can be applied by a variety of methods, including Joule heating of a resistor in the proximity of the probe tip, or optically heating a tip of the thermal probe using a laser. Applications of the invention include identification of voids in metallic layers in semiconductors; mapping dopant concentration in semiconductors; measuring thickness of a sample material; mapping thermal hot spots and other characteristics of a sample material.

In accordance with the present invention, a fiber optic temperature sensing system incorporating a thermal probe which utilizes a phosphor in the form of a microsphere is provided. The microsphere is situated in air so as to produce a lensing effect in both coupling the excitation light delivered to it by the fiber and coupling the fluorescence produced by the phosphor material back into the fiber. The thermal probe can be implemented in either a flexible or a rigid form. Materials for the phosphor microspheres include—but are not limited to—rare earth(s) doped single crystals, rare earth(s) doped ceramics, and ruby. When coupled to a suitable controller, these thermal probes can provide reliable temperature measurements even in environments characterized by strong electrical noise or electromagnetic interference.

The invention relates to a thermal control system for controlling the temperature of a fluid. In particular, the invention relates to a control system having at least two heating elements, at least one of which is used for directly or indirectly heating a fluid, and at least one of which is used for heating a thermal probe used to determine the temperature of the fluid. The heating systems are controlled by at least one feedback controller.

The invention discloses a nano thermoelectric seebeck coefficient in-situ quantitative characterization device based on an atomic force microscope, which is used for detecting a microcell seebeck coefficient of a nano thermoelectric material sample to be detected. The nano thermoelectric seebeck coefficient in-situ quantitative characterization device comprises an atomic force microscope in-situ encouraging platform of harmonic signals and a nano thermoelectric seebeck coefficient in-situ detection platform, wherein the atomic force microscope in-situ encouraging platform is used for providing the atomic force microscope platform for developing the nano thermoelectric seebeck coefficient in-situ quantitative characterization device and simultaneously exciting second harmonic generation and third harmonic generation harmonic signals of a microcell of a nano thermoelectric material in situ; and the nano thermoelectric seebeck coefficient in-situ detection platform is used for realizing in-situ real-time detection and processing of a second harmonic generation and a third harmonic generation of the nano thermoelectric material, and displaying an in-situ characterization result of a thermoelectric parameter of the microcell seebeck coefficient. The nano thermoelectric seebeck coefficient in-situ quantitative characterization device combines an atomic force microscope nano detection function, a macroscopic thermal conductance third harmonic generation testing principle, a Joule thermal effect principle and a macroscopic seebeck coefficient testing principle to establish a new method for characterizing the nano thermoelectric seebeck coefficient based on a harmonic effect induced by a thermal probe of a commercial atomic force microscope.

A measuring device for a heat pipe (40) includes a first platform (100), a second platform (100), a heating member (200), a cooling member (210) and thermal probes (300). The heat pipe (40) includes a first end (42) and a second end (44) opposite to the first end (42). The first platform (100) flexibly receives the first end (42) of the heat pipe (40) therein and the second platform (100) flexibly receives the second end (44) of the heat pipe (40) therein. The heating member (200) is for heating the first end (42) of the heat pipe (40) and the cooling member (210) is for cooling the second end (44) of the heat pipe (40). The thermal probes (300) are received into the first platform (100) and the second platform (100) to measure the temperatures where they are positioned.

The invention discloses a micron-nano thermal detecting and sensing component, comprising a thermal probe for heating and sensing the temperature of a tested sample, a reference probe for detecting an ambient temperature when the thermal probe is used for detecting, a magnetic base used for gripping the baseboard of the thermal probe by a magnetic force and locating the thermal probe, an isolated body arranged below the magnetic base, a locator which is of a pressing board structure and used for pressing the lead of the thermal probe to assist in locating the thermal probe, an output connection body circuit board and a testing support, wherein the output connection body circuit board comprises a printed circuit board and a connector, the printed circuit board is connected with the output end of the reference probe and the output end of the thermal probe, the connector is used for the connection with an external detecting bridge circuit, and the testing support is used for fixing the output connection body circuit board, the magnetic base, the isolated body and the locator. The component provided by the invention has the characteristics of high detecting sensitivity, strong external environment disturbance resistance and the like, and is completely compatible with a commercial atomic force microscope (AFM) to achieve the in-situ acquisition of the topography image and thermal image of the tested sample. The component provided by the invention has the thermal imaging resolution ratio of 60 nanometers which is better than those of the similar imports.