39results about How to "Light collection efficiency" patented technology

An optical system for examination of biological tissue includes a light source, a light detector, optics and electronics. The light source generates a light beam, transmitted to the biological tissue, spaced apart from the source. The light detector is located away (i.e., in a non-contact position) from the examined biological tissue and is constructed to detect light that has migrated in the examined tissue. The electronics controls the light source and the light detector, and a system separates the reflected photons (e.g., directly reflected or scattered from the surface or superficial photons) from the photons that have migrated in the examined tissue. The system prevents detection of the “noise” photons by the light detector or, after detection, eliminates the “noise” photons in the detected optical data used for tissue examination.

An optical system for examination of biological tissue includes a light source, a light detector, optics and electronics. The light source generates a light beam, transmitted to the biological tissue, spaced apart from the source. The light detector is located away (i.e., in a non-contact position) from the examined biological tissue and is constructed to detect light that has migrated in the examined tissue. The electronics controls the light source and the light detector, and a system separates the reflected photons (e.g., directly reflected or scattered from the surface or superficial photons) from the photons that have migrated in the examined tissue. The system prevents detection of the “noise” photons by the light detector or, after detection, eliminates the “noise” photons in the detected optical data used for tissue examination.

An assembly for a charged particle detection unit is described. The assembly comprises a scintillator disc, a partially coated light guide a thin metal tube for allowing the primary charged particle beam to pass through and a photomultiplier tube (PMT). The shape of scintillator disc and light guide are redesigned to improved the light signal transmission thereafter enhance the light collection efficiency. A light guide with a conicoidal surface over an embedded scintillator improved the light collection efficiency of 34% over a conventional design.

Receiving a subject image at good sensitivity by improving the light collection efficiency of incident light, wherein an image pick-up element includes a light-receiving portion, poly-silicon wiring formed on the light-receiving portion, and a well structure. The poly-silicon wiring is arranged so as to be overlapped with at least a part of the light-receiving portion, and is electrically connected to the light-receiving portion to perform the control of electric charges generated at the light-receiving portion, the switching of the light-receiving portion, and the like. The well structure is formed in at least a part of the area of the light-receiving portion in which the poly-silicon wiring is arranged, and the opened area of the well structure is sufficiently secured.

An optical system for examination of biological tissue includes a light source, a light detector, optics and electronics. The light source generates a light beam to be transmitted to the biological tissue spaced apart from the source. The light detector is located away (i.e., in a non-contact position) from the examined biological tissue and is constructed to detect light that has migrated in the examined biological tissue. The electronics controls the light source and the light detector, and a system separates the reflected photons (e.g., directly reflected or scattered from the surface or superficial photons, i.e., “noise” photons) from the photons that have migrated in the examined biological tissue. This system prevents detection of the “noise” photons by the light detector or, after detection, eliminates the “noise” photons in the detected optical data used for tissue examination.

An assembly for a charged particle detection unit is described. The assembly comprises a scintillator disc, a partially coated light guide a thin metal tube for allowing the primary charged particle beam to pass through and a photomultiplier tube (PMT). The shape of scintillator disc and light guide are redesigned to improved the light signal transmission thereafter enhance the light collection efficiency. A light guide with a conicoidal surface over an embedded scintillator improved the light collection efficiency of 34% over a conventional design.

Disclosed is an ordered microelectronic fabrication sequence in which color filters are formed by conformal deposition directly onto a photodetector array of a CCD, CID, or CMOS imaging device to create a concave-up pixel surface, and, overlayed with a high transmittance planarizing film of specified index of refraction and physical properties which optimize light collection to the photodiode without additional conventional microlenses. The optically flat top surface serves to encapsulate and protect the imager from chemical and thermal cleaning treatment damage, minimizes topographical underlayer variations which would aberrate or cause reflection losses of images formed on non-planar surfaces, and, obviates residual particle inclusions induced during dicing and packaging. A CCD imager is formed by photolithographically patterning a planar-array of photodiodes on a semiconductor substrate. The photodiode array is provided with metal photoshields, passivated, and, color filters are formed thereon. A transparent encapsulant is deposited to planarize the color filter layer and completes the solid-state color image-forming device without conventional convex microlenses.

Disclosed is an ordered microelectronic fabrication sequence in which color filters are formed by conformal deposition directly onto a photodetector array of a CCD, CID, or CMOS imaging device to create a concave-up pixel surface, and, overlayed with a high transmittance planarizing film of specified index of refraction and physical properties which optimize light collection to the photodiode without additional conventional microlenses. The optically flat top surface serves to encapsulate and protect the imager from chemical and thermal cleaning treatment damage, minimizes topographical underlayer variations which would aberrate or cause reflection losses of images formed on non-planar surfaces, and, obviates residual particle inclusions induced during dicing and packaging. A CCD imager is formed by photolithographically patterning a planar-array of photodiodes on a semiconductor substrate. The photodiode array is provided with metal photoshields, passivated, and, color filters are formed thereon. A transparent encapsulant is deposited to planarize the color filter layer and completes the solid-state color image-forming device without conventional convex microlenses.

Described is an electrode-less plasma lamp comprising a gas-fill vessel, a gas-fill contained within the gas-fill vessel, an RF electromagnetic radiation source, an RF electromagnetic resonator, an output probe that couples RF energy from the RF electromagnetic resonator to the gas-fill vessel, an input probe that couples RF energy from the RF electromagnetic radiation source to the resonator, and a grounding strap that holds a metal veneer surrounding the resonator and a portion of the gas-fill vessel at RF ground. Also described are many variations of the electrode-less plasma lamp; non-limiting examples of which include embodiments that employ other probes in a Dielectric Resonant Oscillator to drive the lamp, and many methods of improving light-harvesting, including raising the gas-fill vessel away from the resonator via a coaxial type transmission line, and collecting light with an optical reflector.

[Object]To provide an image sensor having high light collection efficiency and less crosstalk among pixels, a production method therefor, and an inspection apparatus.[Solving means]In an image sensor including a light source conversion unit that includes a plurality of light-receiving devices and converts incident light into an electric signal, a plurality of lenses that are provided in an immediately-above area of the light-receiving devices and collect light toward a light-receiving unit of the light-receiving devices positioned right below the lenses, and an insulation layer that is formed of an optically-transparent material and formed above the lenses, detection areas are provided on a surface of the insulation layer while being apart from one another for each of the light-receiving devices, a center of each of the detection areas being positioned on an extended line connecting a center of the light-receiving unit of each of the light-receiving devices and a center of the lens provided right above each of the light-receiving devices. In addition, a sample as a detection target is fixed to at least the detection areas.

An assembly for a charged particle detection device of high detection efficiency is described. The assembly comprising a metal grid for applying attractive potential to lure charged particles; a scintillator disc to absorb the energy from impinging charged particle and reemit the energy in form of light or photons; a light guide to transmit light or photons; and a photomultiplier tube (PMT) cohere with the end of light guide to receive light or photons from light guide and convert it into current signal. A light guide with a bullet-head-shaped front portion ensures total reflection of light propagating within the light guide. A frustum-cone-shaped scintillator disc releases the light that originally trapped in the scintillator disc due to the shape of scintillator.

A photodetector focal plane array system, comprising: a substrate comprising a plurality of photosensitive regions; and a microcomponent disposed adjacent to each of the plurality of photosensitive regions operable for receiving incident radiation and directing a photonic nanojet into the associated photosensitive region. Optionally, each of the microcomponents comprises one of a microsphere and a microcylinder. Each of the microcomponents has a diameter of between ˜λ and ˜100λ, where λ is the wavelength of the incident radiation. Each of the microcomponents is manufactured from a dielectric or semiconductor material. Each of the microcomponents has an index of refraction of between ˜1.4 and ˜3.5. Optionally, high-index components can be embedded in a lower index material. The microcomponents form an array of microcomponents disposed adjacent to the substrate.

[Object]To provide an image sensor having high light collection efficiency and less crosstalk among pixels, a production method therefor, and an inspection apparatus.[Solving means]In an image sensor including a light source conversion unit that includes a plurality of light-receiving devices and converts incident light into an electric signal, a plurality of lenses that are provided in an immediately-above area of the light-receiving devices and collect light toward a light-receiving unit of the light-receiving devices positioned right below the lenses, and an insulation layer that is formed of an optically-transparent material and formed above the lenses, detection areas are provided on a surface of the insulation layer while being apart from one another for each of the light-receiving devices, a center of each of the detection areas being positioned on an extended line connecting a center of the light-receiving unit of each of the light-receiving devices and a center of the lens provided right above each of the light-receiving devices. In addition, a sample as a detection target is fixed to at least the detection areas.

An image sensor includes microlens array having microlenses arranged to constitute rows and columns. When first axis parallel to the rows and passing through array center of the microlens array, and second axis parallel to the columns and passing through the array center are defined, microlens positioned on virtual circle having the array center as center includes first microlens positioned on the first or second axis, and second microlens positioned on neither the first axis nor the second axis. The first and second microlens have non-circular bottom shape, and width of the second microlens in second direction passing through the second microlens and the array center is larger than width of the first microlens in first direction passing through the first microlens and the array center.