The invention relates to an automatic test
system and a test method for realizing the hot plug function of SIM cards, which are used in the automatic test process of intelligent mobile terminals. The method comprises a basic function debugging phase (S1), an automatic
test phase by research and development personnel (S2), and a factory whole-
machine test phase (S3). In the basic function debugging phase, an SIM card empty slot test module tests whether an SIM card slot is empty, and if there is
abnormality, the SIM card slot is maintained, and the method returns to S1. In the automatic
test phase by research and development personnel, a hot plug test module tests the hot plug function of an SIM card inserted into the slot, and if there is
abnormality, the SIM card slot is maintained, and the method returns to S2. In the factory whole-
machine test phase, the hot plug test module tests the hot plug function of an SIM card inserted into the slot, and if there is
abnormality, an intelligent mobile terminal is disassembled, the SIM card slot is maintained, and the method returns to S3. The method ensures that intelligent mobile terminals will be intercepted in the research and development and debugging phase to find out abnormal slots without SIM cards and the abnormality in hot plug function of SIM cards, and SIM card slots can be maintained in time. Therefore, the
test efficiency and production efficiency of factories are improved.