The patent for the invention discloses a matrix type fixture intelligent scanning device and a method thereof, which are applied in the field of impedance testing, and relates in particular to the transformer parameter testing. The matrix type fixture intelligent scanning device includes a pin socket composed of two half-moon shaped metal sheets, electronic switches and a scanning controller. The intelligent scanning method includes the steps of by controlling the switch-on and -off of the electronic switches on the left and right sides connected with the socket, determining, by the scanning controller, whether a transformer pin is inserted into the pin socket; then according to the transformer pin information obtained by scanning, switching on the electronic switch on the left side of the socket in which the pin is inserted, inputting a high level, and reading out the level of the electronic switch on the right side; and determining a coil connection relationship. By adopting the matrix type arrangement and the intelligent scanning technology, the patent for the invention reduces a lot of complicated preparation work such as inserting a transformer into a fixed socket in a transformer test and setting functions of corresponding pins in the fixture, thereby greatly improving the testing efficiency.