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A matrix smart fixture scanning device and method

A scanning device, matrix technology, applied to measuring devices, measuring device casings, instruments, etc., can solve problems such as low efficiency and labor-intensive

Active Publication Date: 2019-07-09
CHANGZHOU UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This method of testing would be labor intensive and inefficient

Method used

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  • A matrix smart fixture scanning device and method
  • A matrix smart fixture scanning device and method

Examples

Experimental program
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Embodiment

[0010] Example: A transformer with 6 pins is inserted into a 4×4 smart fixture, and pins 1 to 6 are inserted into sockets S10, S11, S12, S30, S31, and S32, among which pins 1, 2, Pin 5 has a coil connection relationship, pins 3 and 4 have a coil connection relationship, and pin 6 is an independent pin.

[0011] Pin identification: when the transformer is inserted into the jig, the scan controller first closes the electronic switches K00, K10, K20, K30 on the left side of the first row of sockets through the control bus C01, and sends electronic switches K00, K10, K30 through the address bus D01. The left input terminals of K20 and K30 apply a high level; then the scan controller controls the electronic switch K01 to close through C02, and then reads the level on the right side of K01 through the address bus D02, because the electronic switch K01 passes through D02 on the scan controller The terminal resistance is pulled down to low level, and there is no pin inserted in S00 at...

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Abstract

The patent for the invention discloses a matrix type fixture intelligent scanning device and a method thereof, which are applied in the field of impedance testing, and relates in particular to the transformer parameter testing. The matrix type fixture intelligent scanning device includes a pin socket composed of two half-moon shaped metal sheets, electronic switches and a scanning controller. The intelligent scanning method includes the steps of by controlling the switch-on and -off of the electronic switches on the left and right sides connected with the socket, determining, by the scanning controller, whether a transformer pin is inserted into the pin socket; then according to the transformer pin information obtained by scanning, switching on the electronic switch on the left side of the socket in which the pin is inserted, inputting a high level, and reading out the level of the electronic switch on the right side; and determining a coil connection relationship. By adopting the matrix type arrangement and the intelligent scanning technology, the patent for the invention reduces a lot of complicated preparation work such as inserting a transformer into a fixed socket in a transformer test and setting functions of corresponding pins in the fixture, thereby greatly improving the testing efficiency.

Description

technical field [0001] The invention belongs to the field of transformer parameter testing, and in particular relates to a transformer testing device. Background technique [0002] Electronic transformer is an indispensable magnetic component in current switching power supply and network equipment, and its performance will directly affect the quality of the target product. With the rapid development of smart appliances, a large number of switching power supplies are used in smart appliances to provide energy for electrical equipment, which greatly increases the use of transformers. Transformer manufacturers have to inspect transformers before they leave the factory. At present, most of the existing inspections in the market are based on manual setting of transformer position information, and then workers insert transformers into fixed test sockets to test parameters. This testing method would be labor intensive and inefficient. With the continuous increase of enterprise em...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G01R31/00G01R33/00
CPCG01R1/0416G01R31/00G01R33/00
Inventor 刘玉喜江楠储开斌郭俊俊张小芳
Owner CHANGZHOU UNIV
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