The invention discloses a high-reflective surface three-dimensional measuring device based on a digital micromirror. The device includes a computer, a projector, a first filtering lens, the digital micromirror, a second filtering lens and a CCD camera. The computer generates a grating stripe pattern, and the grating stripe pattern is projected to a to-be-tested high-reflective surface through the projector; the stripe pattern is reflected through the to-be-tested high-reflective surface and then reaches the digital micromirror through the first filtering lens; the digital micromirror controls the mirror element overturning retention time according to an adjustment template, and pixel-level brightness attenuation is conducted on the light intensity of a reflected pattern to make the brightness of the reflected pattern consistent; the reflected pattern of the to-be-tested high-reflective surface is then subjected to secondary reflection through the digital micromirror and enters a photosensitive element of the CCD camera through the second filtering lens, and a digital image of the reflected pattern obtained after the brightness adjustment is obtained; according to the digital image of the reflected pattern, phase distribution is calculated, and finally three-dimensional point cloud of the to-be-tested high-reflective surface is obtained according to a conversion equation.