High-reflective surface three-dimensional measuring device and method based on digital micromirror

Abstract

The invention discloses a high-reflective surface three-dimensional measuring device based on a digital micromirror. The device includes a computer, a projector, a first filtering lens, the digital micromirror, a second filtering lens and a CCD camera. The computer generates a grating stripe pattern, and the grating stripe pattern is projected to a to-be-tested high-reflective surface through the projector; the stripe pattern is reflected through the to-be-tested high-reflective surface and then reaches the digital micromirror through the first filtering lens; the digital micromirror controls the mirror element overturning retention time according to an adjustment template, and pixel-level brightness attenuation is conducted on the light intensity of a reflected pattern to make the brightness of the reflected pattern consistent; the reflected pattern of the to-be-tested high-reflective surface is then subjected to secondary reflection through the digital micromirror and enters a photosensitive element of the CCD camera through the second filtering lens, and a digital image of the reflected pattern obtained after the brightness adjustment is obtained; according to the digital image of the reflected pattern, phase distribution is calculated, and finally three-dimensional point cloud of the to-be-tested high-reflective surface is obtained according to a conversion equation.

Description

technical field [0001] The invention relates to the field of optical projection three-dimensional measurement systems, in particular to a three-dimensional measurement device and method for highly reflective surfaces based on digital micromirrors. Background technique [0002] Objects with a bright surface widely exist in industrial manufacturing, such as engine blades, polishing abrasives, and the automotive industry, and these workpieces also urgently need fast and accurate measurement during the production and manufacturing process to ensure product quality. The existing high-precision surface measurement is mainly based on contact measurement, such as three-coordinate measuring machine, etc., and the measurement speed and efficiency are low. [0003] Structured light 3D measurement technology has the advantages of fast scanning speed, non-contact and dense point cloud, and is widely used in reverse engineering and other applications. Most of the existing structured ligh...

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Problems solved by technology

[0004] The purpose of the present invention is to provide a three-dimensional measurement device and method for highly reflective surfaces based on digital micromirrors, so as to solve the problem that the prior art structured light three-dimensional measurement technology cannot well solve the problem of difficult measurement of highly reflective surfaces

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